“…The main benefit of ellipsometric measurements is the evaluation, for stratified bulk materials, of both the real and imaginary parts of the complex dielectric function ϵ = ϵ 1 + iϵ 2 (which relates to the refractive index, n, and extinction coefficient, k, ϵ = (n + ik) 2 ), through the ellipsometric angles Ψ and Δ, with no need for Kramers-Kronig transforms. Already many authors have relied on spectroscopic ellipsometry to establish the dielectric function of amorphous and crystalline phases of PCMs such as Ge 2 Sb 2 Te 5 [17][18][19], Sb 2 S 3 [9,13,14,20], Sb 2 Se 3 [13,20], among others. However, still challenges exist in establishing the dielectric function of these materials.…”