2003
DOI: 10.1103/physrevb.68.045206
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Internally consistent approach for modeling solid-state aggregation. I. Atomistic calculations of vacancy clustering in silicon

Abstract: A computational framework is presented for describing the nucleation and growth of vacancy clusters in crystalline silicon. The overall approach is based on a parametrically consistent comparison between two representations of the process in order to provide a systematic method for probing the details of atomic mechanisms responsible for aggregation. In this paper, the atomistic component of the overall framework is presented. First, a detailed set of targeted atomistic simulations are described that character… Show more

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Cited by 37 publications
(27 citation statements)
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References 52 publications
(49 reference statements)
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“…The evolutions of some of the cluster sizes are shown in Figure 8 and demonstrate that many more individual species can be probed with such a large simulation thereby providing more mechanistic information for use in continuum models [5,6]. In other words, while the concentrations of trimers and tetramers were too low to provide statistically converged profiles in the 125-interstitial simulations used for validation, the profiles obtained in the larger simulation are well resolved and suitable for direct comparison to continuum model predictions.…”
Section: Self-interstitial Aggregation In Edip Siliconmentioning
confidence: 89%
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“…The evolutions of some of the cluster sizes are shown in Figure 8 and demonstrate that many more individual species can be probed with such a large simulation thereby providing more mechanistic information for use in continuum models [5,6]. In other words, while the concentrations of trimers and tetramers were too low to provide statistically converged profiles in the 125-interstitial simulations used for validation, the profiles obtained in the larger simulation are well resolved and suitable for direct comparison to continuum model predictions.…”
Section: Self-interstitial Aggregation In Edip Siliconmentioning
confidence: 89%
“…[5] using a relatively simple mean field scaling theory. Self-interstitial clusters are found to be highly mobile at 1400 K and cluster coalescence is an important process at early times, contributing substantially to the overall the cluster growth rate [6,28].…”
Section: Self-interstitial Aggregation In Edip Siliconmentioning
confidence: 99%
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“…The codes and simulation initialization approaches used in these simulations have been adapted from Prasad and Sinno. 47,48 The empirical EDIP potential 46 was used in most of the simulations discussed below but a subset of the runs also were carried out with the Stillinger-Weber ͑SW͒ ͑Ref. 49͒ and Tersoff 50 potentials for silicon.…”
Section: Simulation Methodology For Large-scale Simulation Of Intmentioning
confidence: 99%