We investigate the relationship between the Curie temperature T C and the carrier density p in the ferromagnetic semiconductor (Ga,Mn)As. Carrier densities are extracted from analysis of the Hall resistance at low temperatures and high magnetic fields. Results are found to be consistent with ion channeling measurements when performed on the same samples. We find that both T C and the electrical conductivity increase monotonically with increasing p, and take their largest values when p is comparable to the concentration of substitutional Mn acceptors. This is inconsistent with models in which the Fermi level is located within a narrow isolated impurity band.The III-V semiconductor (Ga,Mn)As is one of the most widely studied diluted magnetic materials exhibiting carrier-mediated ferromagnetism. Such systems are characterized by strong coupling between spin, charge and lattice degrees of freedom that may be modified by, for example, piezoelectrically applied stress or local electric fields [1]. (Ga,Mn)As also shows large anomalous magnetotransport effects that provide a 'built-in' sensor of the local magnetization orientation [1,2,3]. In particular, the anomalous Hall resistance (R xy AH ) is proportional to the perpendicular-to-plane component of the magnetization, and offers a sensitive means of probing magnetization and domain wall dynamics in (Ga,Mn)As thin films [3]. On the other hand, the large magnitude of R xy AH has hampered the determination of the carrier density, p, which is a crucial parameter for establishing a theoretical description of (Ga,Mn)As. R xy AH is typically 10-100 times larger than the ordinary Hall resistance, R xy OH , and depends in a non-trivial way on various scattering mechanisms which contribute to the