In this paper, we report on a MOS-like structured Si photodetector whose response range covers UV-VIS-NIR with good responsivity. The devices have an Al/Silicon-Rich Oxide (SRO)/Si MOS-like structure fabricated with standard Si IC technology. Its reverse leakage current is as small as 10 -10 A at V= −5 V. However, when illuminated with white or UV light with intensity of ~3.6 mW/cm 2 , the reverse current increase greatly. The photocurrent to dark current ratio can be as high as 1.5×10 5 for white light and 8.7×10 4 for UV light at V= −5 V, indicating that the structure is very sensitive to both visible and UV light. The spectral response of the device shows good responsivity from 200 nm to near infrared, with maximum responsivity of 0.78 A/W at 900 nm. The role of the SRO layer and the Si substrate in obtaining such a high photoresponse in UV-VIS-NIR range was analyzed.