Proceedings of IEEE Custom Integrated Circuits Conference - CICC '93
DOI: 10.1109/cicc.1993.590575
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Introducing redundancy in field programmable gate arrays

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Cited by 65 publications
(47 citation statements)
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“…Performance and power consumption are also impacted by this scheme because routing must be made longer to allow connections to span a defective row or column. This has been estimated to only cause a 5% increase to interconnect delays [94] but this has not been reevaluated for recent architectures. One new challenge for this defect tolerance scheme is the heterogeneous blocks that are commonly included in modern FPGAs as they add complexity to these coarse-grained redundancy approaches and, with few exceptions [172], such issues have yet to be examined.…”
Section: Manufacturing Defectsmentioning
confidence: 99%
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“…Performance and power consumption are also impacted by this scheme because routing must be made longer to allow connections to span a defective row or column. This has been estimated to only cause a 5% increase to interconnect delays [94] but this has not been reevaluated for recent architectures. One new challenge for this defect tolerance scheme is the heterogeneous blocks that are commonly included in modern FPGAs as they add complexity to these coarse-grained redundancy approaches and, with few exceptions [172], such issues have yet to be examined.…”
Section: Manufacturing Defectsmentioning
confidence: 99%
“…This was first suggested in [94] and was more recently evaluated in [241]. This coarse grain scheme is also used commercially [50,148].…”
Section: Manufacturing Defectsmentioning
confidence: 99%
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“…Cheatham et al (2006), a detailed quantitative analysis of various FT methods (both offline and online) are given. Several techniques used either row-wise shifting or column-wise shifting (Hatori et al, 1993;Caponetto et al, 2007). Hatori et al (1993), the authors provided a single spare column technique for fault toleration.…”
Section: Related Researchmentioning
confidence: 99%
“…Several techniques used either row-wise shifting or column-wise shifting (Hatori et al, 1993;Caponetto et al, 2007). Hatori et al (1993), the authors provided a single spare column technique for fault toleration. The authors used specialized selector circuitry, which is useful to reconfigure faulty FPGAs.…”
Section: Related Researchmentioning
confidence: 99%