Investigating the use of multimeters to measure quantized hall resistance standards

Cage, Marvin E.; Yu, Dingyi; Jeckelmann, B.; Steiner, Reto; Duncan, R. V.

doi:10.1109/tim.1990.1032933

Cited by 20 publications

(12 citation statements)

References 13 publications

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“…The fact that we are not fully outside the 1/f noise region shows up as a noise floor in the Allan deviation of a large set of ratio measurements starting at averaging times larger than approximately 1 h. This noise floor shows that using these switching procedures we cannot obtain uncertainty better than 10 parts in 10 9 . This is almost one order of magnitude lower than in the early work of Cage et al [14], who used a conventional Josephson setup to determine the linearity of the complete 1 V range. A single linearity measurement took them typically 1 h, which is far into the 1/f noise region of the DVM.…”

Section: Application: Quantum Hall Voltage Ratiosmentioning

confidence: 72%

“…The two resistors to be compared are connected in series and a dc current of 45 µA is sent through them. Subsequently, the ratio of the voltages developed over the two resistors is measured [14]. Two HP 3458A DVMs are used in their 1 V range, where each DVM measures the ratio of the voltages over the 10 k resistor and the QHR values of approximately 12.9064 k or 6.4532 k for the i = 2 and i = 4 plateaus, respectively.…”

Section: Application: Quantum Hall Voltage Ratiosmentioning

confidence: 99%

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Voltage linearity measurements using a binary Josephson system

Brom

Houtzager

Rietveld

et al. 2007

Meas. Sci. Technol.

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A fully automated system has been developed for voltage calibrations where fast programmability and extremely low uncertainties are required. This system is based on a binary Josephson junction array with a smallest segment of one single junction. As an important application, the linearity of the 10 mV range of a digital nanovoltmeter was determined with a standard uncertainty better than 1 nV. As a further application of the fast programmability of the binary Josephson system, the standard uncertainty of voltage ratios measured by an -digit digital voltmeter in quantum Hall measurements was measured to be 10 × 10−9.

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Section: Application: Quantum Hall Voltage Ratiosmentioning

confidence: 72%

Section: Application: Quantum Hall Voltage Ratiosmentioning

confidence: 99%

Voltage linearity measurements using a binary Josephson system

Brom

Houtzager

Rietveld

et al. 2007

Meas. Sci. Technol.

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“…The combined standard uncertainty for the above measurement results is derived according to the law of propagation of uncertainty given by the ISO/IEC GUM Guide [19] and is described in appendix B. From the results, the main uncertainty factors are the applied voltage, DMM voltage measurement, DMM input resistance and bias current effect, reference resistance, lead wires and temperature effects [20,21]. These uncertainty factors are analyzed in the following, and an uncertainty budget for the factors is estimated as shown in table 3.…”

Section: Uncertainty Analysis and Estimationmentioning

confidence: 99%

“…The input resistance of the DMM was measured using the method described by Cage et al [21] and the value, measured at 23 • C and a relative humidity of 60%, was 1.9(5) × 10 12 . The system leakage resistance was measured to be greater than 3 × 10 13 .…”

Section: Dmm Input Resistancementioning

confidence: 99%

A method for measuring high resistances with negligible leakage effect using one voltage source and one voltmeter

Yu¹,

Kim²,

Lee³

et al. 2014

Meas. Sci. Technol.

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We present a method for measuring high resistances using one voltage source and one voltmeter. With this method, there exist two techniques. One is to measure a high resistance with a much lower resistance and the other is to cancel the leakage effect effectively using two nominally equal resistances without an auxiliary guarding apparatus. To demonstrate the method's validity, a 1 GΩ resistance was measured using the two techniques replacing a dummy 1 GΩ resistance as a leakage resistance; the measurement results agree well with the theoretical results within the measurement uncertainty of 3 × 10−6 (k = 2) level. We used the method to determine 10 MΩ, 1 GΩ and 1 TΩ resistances with an active-guard type and a T-type. The best expanded uncertainties at k = 2 from the results were estimated as 0.3 × 10−6, 0.8 × 10−6 and 20 × 10−6, respectively. We also show that while the expanded uncertainty of 70 × 10−6 is obtained using an 81/2 digit digital multimeter, it is improved to 20 × 10−6 using an electrometer with high-input resistance, low bias current and high resolution when the second technique is used to measure high resistances.

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“…The ADC is part of an auto-calibrating 8.5 digit DMM [142] which is used in the DC voltage mode. These DMMs are known to exhibit non-linearity in voltage of <1×10 -7 [143]. Referring to figure 5.7, the excitation current is sourced directly through the reference resistor R S and the DUT (thermometer) resistance R x and two voltages are measured on the DMM, V R+ and V S+ , which are the potential differences across the unknown and the reference, respectively.…”

mentioning

confidence: 99%

Calibration of Cryogenic Resistance Thermometers between 0.65 K and 165 K on the International Temperature Scale of 1990

Tew¹

2015

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Table of Contents vi 6.5 RIRT resistance measurement uncertainty components for temperatures over the range 0.65 K to 83.8 K. 6.6 Comparison uncertainties for extended range RIRT calibrations. 6.7 RIRT total calibration uncertainties for an extended range calibration from 0.65 K to 83.8 K 6.8 GeRT resistance measurement uncertainty components, a. expressed in mΩ/Ω, b. expressed in mK equivalents. 6.9 GeRT calibration uncertainties in the range 0.65 K to 24.556 K. vii List of Tables 2.1 Regular SP-250 Catalog Services for Cryogenic Resistance Thermometer Calibrations performed entirely within the NIST LTCF. 2.2 Regular SP-250 Catalog Services for capsule-type SPRT Calibrations performed jointly between the NIST LTCF and SPRT Calibration Laboratory. 3.1 The fixed points of the ITS-90 used for realization purposes at NIST. 3.2 Subranges for the SPRT definitions of the ITS-90 below 273.16 K. 3.3 Coefficients for the ITS-90 reference function and inverse function for T ≤273.16 K 3.4 The fixed points of the ITS-90 used for realization of the ICVGT definition at NIST. 3.5 Coefficients used for the 3 He and 4 He vapor pressure equations (equation 3.11). 4.1 Summary of fixed-point cells currently used at NIST for calibration of capsule SPRTs as NIST check Thermometers. 5.1 Summary of calibration history of NIST capsule check thermometers 1996-2007. 5.2 Cryostat Refrigeration Modes. 5.3 The typical set of comparison temperatures, definitions, and measurement currents used for calibrations of cryogenic RTs. 5.4 Temperature ranges and reference resistor values for AC resistance measurements of MPRTs and SPRTs. 6.1 Measurement parameters for the eight fixed-point temperatures used for calibration of a customer capsule SPRT over the range 13.8033 K to 273.16 K. 6.2 Uncertainty parameters for 4 LTCF standard Resistors used in batch calibrations. 6.3 Comparison uncertainties for NIST comparison calibrations of SPRTs from 13.8 to 83.8 K. 6.4 Calibration uncertainties for NIST check SPRTs as used in the LTCF. 6.5 ITS-90 calibration parameters for a batch RIRT. 6.6 ITS-90 calibration parameters for a batch GeRT.

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Investigating the use of multimeters to measure quantized hall resistance standards

Abstract: A new generation of digital multimeters was used to compare the ratios of the resistances of wire-wound reference resistors and quantized Hall resistances. The accuracies are better than 0.1 ppm for ratios as large as 4: 1 if the multimeters a~ calibrated with a Josephson array.

Cited by 20 publications

References 13 publications

Voltage linearity measurements using a binary Josephson system

Voltage linearity measurements using a binary Josephson system

A method for measuring high resistances with negligible leakage effect using one voltage source and one voltmeter

Calibration of Cryogenic Resistance Thermometers between 0.65 K and 165 K on the International Temperature Scale of 1990

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