Investigation of dielectric constant for PbTiO
            <sub>3</sub>
            film in THz range

Luo, Chunya; Li, Dan; Liu, Jiakai; Ma, Zhichao

doi:10.1080/00150193.2023.2215519

Cited by 1 publication

(2 citation statements)

References 19 publications

Supporting

Mentioning

Contrasting

Order By: Relevance

“…[1][2][3][4][5][6][7][8][9][10]. Lead titanate (PbTiO 3 ) is a well-known perovskite-type structure of ferroelectric material due to its unique ferroelectric, piezoelectric and pyroelectric properties [4,11,12]. Bulk ceramics of lead titanate are already used in many devices.…”

Section: Introductionmentioning

confidence: 99%

“…However, the use equipment is expensive, and to obtain the desirable film composition, an adapted target composition is required [15,16]. Magnetron sputtering is one of the most prospective methods for PbTiO 3 thin film formation because of its high deposition rate, the possibility of using commercially available large area deposition systems, the control of the substrate temperature during the deposition and the relatively low cost [12,15,17,[20][21][22][23][24]. R. Nishino et al [15] investigated thin PbTiO 3 films synthesized using pulsed laser deposition and discovered that the remnant polarization depended on the thickness of the PbTiO 3 films.…”

Section: Introductionmentioning

confidence: 99%

See 1 more Smart Citation

Influence of the Annealing Environment on the Structure and Ferroelectric Properties of Lead Titanate Thin Films

Iljinas,

Stankus,

Marcinauskas

2023

Coatings

View full text Add to dashboard Cite

Lead titanate thin films of pyrochlore phase were deposited using layer-by-layer reactive magnetron sputtering on a heated platinized silicon substrate. It was found that the pyrochlore phase transition to the perovskite phase was initiated at 700 °C, and the properties of the PbTiO3 films could be controlled by changing the annealing environment. The thin films annealed in air and oxygen environments (1.33 Pa) have a tetragonal structure. The highest values of remnant polarization and the coercive field were 38 μC/cm2 and 130 kV/cm, respectively, but the largest dielectric loss was determined for the films annealed in air. The remnant polarization, coercive field and dielectric loss were reduced when the annealing of films was performed using oxygen gas at 1.33 Pa pressure. The films annealed in vacuum showed a rhombohedral (and ferroelectric) structure with the lowest remnant polarization and coercive field values. Such a structure was not observed for lead titanate at room temperature. It was observed that the surface morphology strongly depended on the reaction rate, which was influenced by the oxygen concentration in the environment.

show abstract