Investigation of Electrical Double Layers on SIO2 Surfaces by Means of Force vs. Distance Measurements

Chemical and Biochemical Analysis Using Scanning Force Microscopy

“…At a pH of 6.2, however, the double-layer interaction vanished, indicating that the Si 3 N 4 surface was not charged and that the IEP of Si 3 N 4 is 6.2. In similar experiments using a Si 3 N 4 tip and an alumina surface, Raiteri and co-workers 206 determined the IEP of Si 3 N 4 to be at pH 6.5, a finding similar to that of Lin et al Furthermore, Huttl and co-workers 207 have examined the pH dependence of the forces between a silicon oxide tip and a silicon oxide surface.…”

Force measurements with the atomic force microscope: Technique, interpretation and applications

“…With the AFM DLVO forces were measured between several materials which are of special interest in colloidal science, e.g. glass, silica, and silicon nitride [15,16,187,[427][428][429][430][431][432][433][434]; gold [327,429,435,436]; copper and nickel [437]; zinc and lead sulphide [171,172,438]; titanium oxide [169,339,340]; zirconia [165,166,410]; iron oxide [439]; tungsten [175]; cobalt [175]; and alumina [16,[439][440][441][442]. Different polymers [177,189,[443][444][445][446][447], Langmuir-Blodgett and other thin organic layers [126,329,411,448,449] have been analyzed.…”

AFM study of forces between silica, silicon nitride and polyurethane pads

“…A standard RSET silicon tip with initial nominal tip radius <10 nm was oxidized in air during 2 h in 1000 • C as described in [25]. The tip was immersed in aqueous solution of pH 9 to age the obtained silica surface (to recover enough silanol groups).…”