“…The depth distribution of radiation-induced defects in thin foils has been investigated in several materials [1,4,19,38,52,53] to better describe irradiated microstructures and understand the mechanism of the defect formation. In the literature, the thickness of depleted zones was found to be about 12 nm at 300°C and 20 nm at 400°C in Ni under Ar + irradiation [1] for each side of the foil.…”