2016
DOI: 10.1007/s40089-016-0187-6
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Investigation of nanostructured Pd–Ag/n-ZnO thin film based Schottky junction for methane sensing

Abstract: Undoped nanocrystalline n-type ZnO thin film was deposited by chemical deposition technique on a thermally oxidized p-Si (*5 X cm resistivity and \100[ orientation) substrate. Formation of stable zinc oxide thin film was confirmed by two-dimensional X-Ray Diffraction (XRD) and EDX analysis. The average crystallite size of the ZnO sample was evaluated as *50 nm. The surface was characterized by Field Emission Scanning Electron Microscopy (FESEM) and Atomic Force Microscopy (AFM) that confirm the formation of na… Show more

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Cited by 11 publications
(4 citation statements)
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“…XRD pattern of AZO on glass substrates show three weak peaks appearing at 31.7, 34.0, and 36.0° related to (100), (002) and (101) planes, respectively, of ZnO in its hexagonal structure with a little shift to lower degrees which can be assigned to Al in this structure according to the JPDS card No. [0075-080-01] [9,10], which indicates the existence of aluminum in the segregation boundaries and increase of the oxygen capture content by the Al 3+ ions compared to Zn 2+ with a larger atomic charge, and the tension or strain resulting from it will cause the (002) plane to move toward the lower degrees [14]. To calculate the average size of the crystalline domains of deposited films, we used the Debye-Scherrer equation as follows [15,16]:…”
Section: Structural and Optical Analysismentioning
confidence: 99%
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“…XRD pattern of AZO on glass substrates show three weak peaks appearing at 31.7, 34.0, and 36.0° related to (100), (002) and (101) planes, respectively, of ZnO in its hexagonal structure with a little shift to lower degrees which can be assigned to Al in this structure according to the JPDS card No. [0075-080-01] [9,10], which indicates the existence of aluminum in the segregation boundaries and increase of the oxygen capture content by the Al 3+ ions compared to Zn 2+ with a larger atomic charge, and the tension or strain resulting from it will cause the (002) plane to move toward the lower degrees [14]. To calculate the average size of the crystalline domains of deposited films, we used the Debye-Scherrer equation as follows [15,16]:…”
Section: Structural and Optical Analysismentioning
confidence: 99%
“…Their structural, electrical, and morphological properties have been characterized and we have also determined the Cu 2 O/AZO heterojunction diode properties [4]. The result showed a low turn-on voltage of about 0.64 V, which indicates that the heterojunction acts as a rectifier diode [9]. Thus, the result of experiment and theory is quantitatively compared at high temperature because the voltage of the film is measured at 10 V. We obtain good agreement between the experiment and theory for the temperature-dependent resistivity of the film.…”
Section: Introductionmentioning
confidence: 98%
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“…ZnO is an attractive compound for solid state semiconductor devices because of its electronic, piezoelectric and optical characteristics. This material is easy to synthesize, environmentally friendly, cost-effective, and has high exciton binding energy and self-assembly of different nanostructure size and shapes [5][6][7][8] . ZnO nanostructures include nanoparticles, nanorods, nanowire, nanorings, nanoflakes, nanocombs, nanoflowers, nanosprings and nanobelts [8,9] .…”
Section: Introductionmentioning
confidence: 99%