Investigation of Reverse Recovery Current of High-Power Thyristor in Pulsed Power Supply

Wei, Jiufu; Li, Zhenxiao; Li, Baoming

doi:10.3390/electronics9081292

Cited by 6 publications

(6 citation statements)

References 14 publications

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“…However, the thyristor may experience performance degradation or damage when exposed to high-power repetitive and large surge current [6]. Mastering the damage mechanism of the thyristor is of great significance to the protection of the thyristor and the stability of pulse power equipment.…”

Section: Introductionmentioning

confidence: 99%

Failure mechanisms of the thyristor switch in pulsed arc electrohydraulic discharges

Yu,

Kang

2024

Semicond. Sci. Technol.

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In order to study the failure mechanism of the thyristor switch in the application of electric pulse fracturing, an underwater pulse power discharge experimental platform was built, the impedance characteristics of the plasma channel were analyzed and the circuit equivalence was carried out for each discharge stage. Then, based on the Silvaco simulation software, a theoretical thyristor model was established. By observing the distribution of the internal carriers and current density, the turnon and turn-off processes of the thyristor switch under high voltage were analyzed. The formation factors of peak voltage in the turn-off process were studied, the easy breakdown position was pointed out, and a method to suppress the reverse peak voltage by creating critical damping oscillations in the discharge circuit was proposed. Finally, a pulsed power discharge experiment was carried out to verify the theoretical analysis. The experimental results show that the discharge waveform conforms to the theoretical analysis, and the high voltage breakdown damage of the thyristor is also consistent with the theoretical simulation model. Furthermore, the proposed thyristor protection method can greatly suppress the reverse voltage spike, reduce the peak voltage by 52%, and effectively avoid the damage caused by withstand voltage breakdown in the application of pulse power discharge.

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Section: Introductionmentioning

confidence: 99%

Failure mechanisms of the thyristor switch in pulsed arc electrohydraulic discharges

Yu,

Kang

2024

Semicond. Sci. Technol.

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“…Because of the high peak power output, pulsed power technology has gained important applications in industrial fields [1,2]. As the core component of pulse power system, the characteristics of pulse power switch affect the performance level of pulse power system directly.…”

Section: Introductionmentioning

confidence: 99%

Investigation and Improvement of Switching Characteristics of SiC Optically Controlled Transistor

Zhang

2022

J. Phys.: Conf. Ser.

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Aiming to the switching characteristics of SiC optically controlled transistor, SiC NPN optically controlled transistor was investigated through Silvaco TCAD. The results show that under 4500V bias voltage, the turn-on and turn-off dV/dt of the SiC transistor are 428.5V/ns and 23.9V/ns, respectively. And the tailing problem in the turn-off process is obvious. In order to improve the switching characteristics of SiC optically controlled transistor, the minority carrier lifetime in base layer is regional controlled. The simulation results indicate that, by using minority carrier lifetime control technology, the turn-off time and turn-off dV/dt are improved by about 28.2% and 39.3%, respectively. Meanwhile, turn-on time and turn-on dV/dt are only degenerated by about 3.6% and 3.4%, respectively. The overall level of switching characteristics of SiC optically controlled transistor are improved.

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“…Reliability is more and more a key problem in engineering, especially in the field of electronics, as witnessed by a recent special issue on this topic, focused on Power electronic devices reliability [1][2][3][4][5][6][7][8][9][10][11][12][13][14][15][16]. Nowadays, indeed, these are becoming more and more critical devices, since-as highlighted in [16]-ower electronics plays a crucial role in renewable energy systems, lighting, electric mobility, and other systems that enable sustainable development.…”

Section: Introductionmentioning

confidence: 99%

The Decreasing Hazard Rate Phenomenon: A Review of Different Models, with a Discussion of the Rationale behind Their Choice

Chiodo

Mazzanti

2021

Electronics

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It is well known that, especially in the field of electronic components reliability studies and applications, the Exponential reliability model is by far the most adopted, although the data fostering it are few. This appears to be due partly to its simplicity (also in view of estimation, since it is characterized by a unique parameter), and partly because most components seem to be well represented, at least in their “useful life” time interval, by the Exponential model. This adoption is basically due to its peculiar “memory-less” property, i.e., the fact that such model possesses a constant hazard rate function, meaning that stochastic “accidents” cause the failure of the component, independently of its service time. This theoretical reason behind the choice of the Exponential model is largely prevailing over the classical statistical “goodness of fit” tests, since the high-reliability values attained by such devices does not allow the availability of an adequate number of lifetime values to be observed and analyzed in a statistical data analysis procedure. A second model also widely adopted is the Weibull model, especially if characterized by a shape parameter greater than unity, so implying an increasing hazard rate function. However, there are many cases—which can be also justified on a theoretical basis, as reviewed in this paper—in which a decreasing hazard rate function (at least for relatively large mission times) may be the best suited to describe the true model behind a given failure mechanism. The afore-mentioned theoretical basis of these apparently peculiar models is the main core of the present review article, whose aim also includes the illustration of the basic features of the main reliability models featuring an hazard rate function diminishing with time. The paper also discusses, resorting to graphical and numerical case-studies relevant to both field and simulated data, the consequences of mistaken model identification in terms of the hazard rate function behaviour, which may imply wrong maintenance actions.

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Investigation of Reverse Recovery Current of High-Power Thyristor in Pulsed Power Supply

Cited by 6 publications

References 14 publications

Failure mechanisms of the thyristor switch in pulsed arc electrohydraulic discharges

Failure mechanisms of the thyristor switch in pulsed arc electrohydraulic discharges

Investigation and Improvement of Switching Characteristics of SiC Optically Controlled Transistor

The Decreasing Hazard Rate Phenomenon: A Review of Different Models, with a Discussion of the Rationale behind Their Choice

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