2015
DOI: 10.1109/tcpmt.2015.2442751
|View full text |Cite
|
Sign up to set email alerts
|

Investigation of Stress in MEMS Sensor Device Due to Hygroscopic and Viscoelastic Behavior of Molding Compound

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
4
1

Citation Types

0
14
0

Year Published

2016
2016
2021
2021

Publication Types

Select...
7
1
1

Relationship

0
9

Authors

Journals

citations
Cited by 27 publications
(14 citation statements)
references
References 22 publications
0
14
0
Order By: Relevance
“…By the process simulation, it has been shown that most of the thermal stress on the sensor chip is generated during the cooling process, and the stress during curing process can be neglected for its relative low modulus. According to the results reported by Kim et al [42,71], the modulus, CTE and glass transition temperature T g are the key parameters for compound material selection. Materials with low modulus, low CTE and low T g can be the candidates to limit the thermal stress on sensor chip.…”
Section: Inducements To Thermal-performance Instabilitymentioning
confidence: 99%
See 1 more Smart Citation
“…By the process simulation, it has been shown that most of the thermal stress on the sensor chip is generated during the cooling process, and the stress during curing process can be neglected for its relative low modulus. According to the results reported by Kim et al [42,71], the modulus, CTE and glass transition temperature T g are the key parameters for compound material selection. Materials with low modulus, low CTE and low T g can be the candidates to limit the thermal stress on sensor chip.…”
Section: Inducements To Thermal-performance Instabilitymentioning
confidence: 99%
“…Firstly, the resistance of piezoresistors and piezoresistive coefficient will vary with the temperature, which will influence the zero-offset and sensitivity of the device [38]. Then, as a stress-based transduction device, the residual stresses from the chip fabrication process [39,40], wafer bonding [41], adhesion and compound molding [42,43] can lead to obvious variations in sensor parameters. Meantime, the difference of coefficient of thermal expansion (CTE) between the materials will induce a significant accompanying stress in the device, and the effect varies under different ambient temperatures for different sensors [44,45,46].…”
Section: Introductionmentioning
confidence: 99%
“…He used the experimental data for numerical simulation, and estimated the temperature and humidity stress of MEMS sensor device under temperature cycle. Although his research is more accurate, but the lack of necessary experimental data [2]. Park DH studied the influence of the MEMS airbag sensor package module on the signal.…”
Section: Introductionmentioning
confidence: 99%
“…In the past, a lot of research was also carried out to understand the impact of hygro-thermo-mechanical stresses induced in MEMS sensor device packages [17][18][19][20][21][22]…”
Section: Introductionmentioning
confidence: 99%