Investigation of structural and optical parameters of yttrium-doped ZnO thin films prepared via spin coating of simple aqueous solution

Bashir, Aneeqa; Majeed, Anam; Naseem, Shahzad; Bhatti, Arshad Saleem

doi:10.1007/s12034-021-02391-9

Cited by 8 publications

(3 citation statements)

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“…The purpose of this study was not only to investigate the impact of UV-A (320-400 nm) exposure on ZrO 2 films' structural and optical properties but also use solution processing which does not pose any threat to the environment and also does not rely on cumbersome procedures involved in sol-gel method. Our group has recently reported high performance Y-doped ZnO films fabricated by water-based solution without the need to prepare sol-gel [23] and we have applied the same approach for fabrication of ZrO 2 thin films, in this report. The water soluble precursors allow film formation at low temperatures in contrast to the organometallic precursors generally used in solution processing.…”

Section: Introductionmentioning

confidence: 99%

UV-A Treatment of ZrO2 Thin Films Fabricated by Environmental Friendlier Water-Based Solution Processing: Structural and Optical Studies

et al. 2021

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An environmentally friendlier solution processing has been introduced to fabricate zirconium oxide (ZrO2) films on quartz substrates, using spin coating of simple water-based solution. The films cured with UV-A = 330 nm for different times (40, 80, 120 min) were investigated for structural and optical properties and compared with thermally annealed film (at 350 °C). XRD and Raman spectroscopy showed amorphous structure in all the samples with no significant phase transformation with UV-A exposure. AFM microscopy showed smooth and crack free films with surface roughness ≤2 nm that reduced with UV-A exposure. Ultraviolet-visible (UV–Vis) spectroscopy demonstrated optical transmittance ≥88% and energy band gap variations as 4.52–4.70 eV. Optical constants were found from spectroscopic ellipsometry (SE). The refractive index (n) values, measured at 470 nm increased from 1.73 to 2.74 as the UV-A exposure prolonged indicating densification and decreasing porosity of the films. The extinction coefficient k decreased from 0.32 to 0.19 indicating reduced optical losses in the films under the UV-A exposure. The photoluminescence (PL) spectra exhibited more pronounced UV emissions which grew intense with UV-A exposure thereby improving the film quality. It is concluded that UV-A irradiation can significantly enhance the optical properties of ZrO2 films with minimal changes induced in the structure as compared to thermally treated film. Moreover, the present work indicates that water-based solution processing has the potential to produce high-quality ZrO2 films for low cost and environmental friendlier technologies. The work also highlights the use of UV-A radiations as an alternate to high temperature thermal annealing for improved quality.

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Section: Introductionmentioning

confidence: 99%

UV-A Treatment of ZrO2 Thin Films Fabricated by Environmental Friendlier Water-Based Solution Processing: Structural and Optical Studies

et al. 2021

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“…The latter is one of the characteristics phonon modes used to identify the crystalline phase (wurtzite) of ZnO [35] including E 2 (high), A 1 (LO), and E 1 (LO), etc. [24].…”

Section: Raman Spectroscopy Studiesmentioning

confidence: 99%

“…To address and rectify these issues, the research interest has, therefore, shifted to a new paradigm of water-based solution processing [22], employed earlier for ZnO-based transistor applications using inkjet printing. It is quite recent that our group has successfully developed ecofriendly water-based solution processing, which need not rely on sol gel preparation to fabricate oxide-based thin films [23,24]. The same methodology has been applied in this report.…”

Section: Introductionmentioning

confidence: 99%

Ecofriendly Water-Based Solution Processing: Preliminary Studies of Zn-ZrO2 Thin Films for Microelectronics Applications

et al. 2021

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This paper demonstrates the high yield and cost effectiveness of a simple and ecofriendly water-based solution processing, to produce Zinc-doped Zirconia (Zn-ZrO2) composite thin films, onto glass substrates, with excellent optical properties that make them of great interest for optical and microelectronics technologies. The effect of Zn variation (given as 10, 15, 20 at.%) on the crystallization, microstructure, and optical properties of ZrO2 film was examined. The addition of Zn did not restructure the ZrO2 lattice, as the results indicated by X-ray diffraction (XRD) and Raman spectroscopy revealed neither any mixed or individual phases; rather, all the films retained the amorphousness. Nonetheless, Zn did control the grain formation at the film surfaces, thereby changing the surface morphology. Atomic force microscopy (AFM) and scanning electron microscopy (SEM) evidenced homogeneous, compact, crack-free, and dense films with surface roughness below 2 nm indicating smooth surfaces. The films were highly transparent (>80%) with tunable optical band gap Eg (5.21 to 4.66 eV) influenced by Zn dopant. Optical constants such as refractive index (n), extinction coefficient (k), and dielectric constant (ε) were obtained from spectroscopic ellipsometry (SE), and a correlation was established with respect to the doping level. A high value of n > 2 value indicated high packing density in these films, and it decreased slightly from 2.98 to 2.60 (at 632 nm); whereas, optical losses were brought down with increasing Zn indicated by decreasing k values. The photoluminescence (PL) spectra showed UV emissions more pronounced than the blue emissions indicating good structural quality of all the films. Nonetheless, added defects from Zn had suppressed the PL emission. The technique presented in this work, thus, manifests as high performance and robust and has the potential comparable to the sophisticated counter techniques. Furthermore, the Zn-ZrO2 films are promising for a low-cost solution to processed microelectronics and optical technologies after reaching high performance targets with regards to the electrical properties.

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Y-Doping Effect on ZnO Properties

Boufelgha,

Zellagui,

Benachour

et al. 2024

Springer Proceedings in Energy

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Investigation of structural and optical parameters of yttrium-doped ZnO thin films prepared via spin coating of simple aqueous solution

Cited by 8 publications

References 68 publications

UV-A Treatment of ZrO2 Thin Films Fabricated by Environmental Friendlier Water-Based Solution Processing: Structural and Optical Studies

UV-A Treatment of ZrO2 Thin Films Fabricated by Environmental Friendlier Water-Based Solution Processing: Structural and Optical Studies

Ecofriendly Water-Based Solution Processing: Preliminary Studies of Zn-ZrO2 Thin Films for Microelectronics Applications

Y-Doping Effect on ZnO Properties

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