Investigation of the Effect of Magnification, Accelerating Voltage, and Working Distance on the 3D Digital Reconstruction Techniques

Bayazid, Seyed Mahmoud; Brodusch, Nicolas; Gauvin, Raynald

doi:10.1155/2020/3743267

Cited by 3 publications

(1 citation statement)

References 25 publications

(25 reference statements)

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“…In soil mechanics, the application of charged micrographs is not used, and it will give only particle size but, not the morphology for microstructure analysis. However, the article is not included the direction of specimen charging relevant to the beam energy interval (Grella et al, 2004), Shrinking effect (Flatabø et al, 2017), accelerating voltage (Chetana et al, 2022), working distance (Bayazid et al, 2020), and scanning time and inclination of the beam (Ichinokawa et al, 1974). The article presents the preparation of soil particles for SEM imaging and the effect of particle size, and number of conductive coatings on charging effect.…”

Section: Introductionmentioning

confidence: 99%

Charging Effect on Soil Particles in Scanning Electron Microscopy (SEM)

Venkateswarlu,

Singh,

Rao

et al. 2023

bultechenukz

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Scanning Electron Microscope (SEM), a tool for material characterization reveals information about surface and subsurface, composition, and defects in bulk materials. The objective of the article is to understand the parameters of soil particles on charging effect in scanning electron microscopy (SEM). The SEM images were obtained on colluvium soil particles by varying particle size (A=2-1mm, B=0.6-0.425mm, C=0.3-0.212mm, and D= <0.075mm), and number of conductive coatings (uncoated, single, and double). The article proposes a method for the preparation of soil particles for SEM imaging and is applicable for all types of soil particles. The study revealed that the soil particles of size greater than 212μm require double conductive coating and less than 75μm requires single coating to avoid charging effect. The sharpness of the image is questionable of soil particles greater than 212μm at 10000× magnification and above after double conductive coatings.

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Section: Introductionmentioning

confidence: 99%

Charging Effect on Soil Particles in Scanning Electron Microscopy (SEM)

Venkateswarlu,

Singh,

Rao

et al. 2023

bultechenukz

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Fracture analysis under modes I and II of adhesive joints on CFRP in saline environment

Vigón,

Argüelles,

Lozano

et al. 2024

npj Mater Degrad

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Reference gage calibration methods of probe nanometry systems

Antsyferov

Karabanov

Rusanov

et al. 2021

J. Phys.: Conf. Ser.

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Reference gage calibration methods of probe nanometry systems are considered in this work. Existing methods for calibrating reference standards provide high measurement accuracy, but at the same time are distinguished by a high complexity of practical implementation, in particular, the interferometric method, or low accuracy, but with simple practical implementation. Therefore, the urgent task is to develop a calibration methodology that provides a sufficiently high measurement accuracy with a relatively simple practical implementation. The paper proposes a methodology based on the combined use of two methods: a comparative assessment of the step heights of the calibrated gages using one of the probe nanometry systems and the precision measurement of the step height of one of the calibrated gages by computer three-dimensional reconstruction of images in a scanning electron microscope. The components of the measurement uncertainty arising when determining the height of the steps of the calibration standards are investigated. The calculated value of the expanded uncertainty showed that the achievable measurement accuracy is comparable to the accuracy of the interferometric method with a simpler practical implementation. Practical testing of the proposed methodology has shown that the use of calibration techniques developed on its basis provides high accuracy and reproducibility of the results obtained.

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Investigation of the Effect of Magnification, Accelerating Voltage, and Working Distance on the 3D Digital Reconstruction Techniques

Cited by 3 publications

References 25 publications

Charging Effect on Soil Particles in Scanning Electron Microscopy (SEM)

Charging Effect on Soil Particles in Scanning Electron Microscopy (SEM)

Fracture analysis under modes I and II of adhesive joints on CFRP in saline environment

Reference gage calibration methods of probe nanometry systems

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