2009
DOI: 10.1111/j.1551-2916.2008.02858.x
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Investigation of the Effect of Cerium Doping on the Electrical Properties and Leakage Current Behavior of Lead Zirconate Thin Films Derived by the Sol–Gel Method

Abstract: Undoped and cerium (Ce)‐doped (1 and 5 mol%) antiferroelectric thin films were obtained by a sol–gel process. All lead zirconate, PbZrO3 (denoted as PZ), films crystallized in the perovskite phase with a full [111] pseudocubic orientation and with a uniform microstructure. X‐ray photoelectron spectroscopic investigations revealed that the oxidation state of Ce is 3+ leading to an A‐site donor doping. Ce doping causes a decrease in the dielectric constant from 200 to 155 and an increase in the forward switching… Show more

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Cited by 26 publications
(11 citation statements)
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“…This result is in good agreement with the properties of other types of perovskite materials . This result can be mainly attributed to the random distribution of La 3+ at the A-site of the perovskite structure, which may relatively increase the disorder of the cation at the A-site and alter the lattice structure …”
Section: Resultssupporting
confidence: 87%
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“…This result is in good agreement with the properties of other types of perovskite materials . This result can be mainly attributed to the random distribution of La 3+ at the A-site of the perovskite structure, which may relatively increase the disorder of the cation at the A-site and alter the lattice structure …”
Section: Resultssupporting
confidence: 87%
“…Figure also shows the energy dispersive spectrometry mapping of the PLH-0.01 film. The homogeneous diffusion of La 3+ into the lattice structure of the PbHfO 3 group increases the disorder of the cations at the A-sites and changes the lattice structure …”
Section: Resultsmentioning
confidence: 99%
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“…The positive linear relationship between the log ( J ) and log ( E ) was obtained, indicating that the films show the space charge limited current behaviors, so the space charge is the main reason for the leakage of the films rather than the oxygen vacancy. [ 34 ] In addition, it is worth mentioning that the slope increases in the films annealed at 620 °C for 6 min as the external electric field increases, which could be attributed to the charge accumulation at the film interface. [ 35 ] All the prepared films have low leakage current, which could enhance the breakdown field strength, improving the energy storage density.…”
Section: Resultsmentioning
confidence: 99%