2008
DOI: 10.1109/ted.2008.923561
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Investigation of the Nonthermal Mechanism of Efficiency Rolloff in InGaN Light-Emitting Diodes

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Cited by 117 publications
(93 citation statements)
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“…Our non-isothermal model computations are consistent with the experimental findings by Yang et al [21]. Two injection current modes were used in [21].…”
Section: Led Structures and Simulation Parameterssupporting
confidence: 86%
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“…Our non-isothermal model computations are consistent with the experimental findings by Yang et al [21]. Two injection current modes were used in [21].…”
Section: Led Structures and Simulation Parameterssupporting
confidence: 86%
“…Besides, it is observed that the spectrum of sample B does not exhibit peak shift, compared with that of the sample A at the same injection current. Yang et al [21] reported the noticeable red shift of the LED spectrum due to self-heating effect. But Figures 8 and 9 show the similar temperature profiles for samples A and B, leading to almost the same heat effect.…”
Section: Led Structures and Simulation Parametersmentioning
confidence: 99%
See 1 more Smart Citation
“…[1][2][3] In the past decade, multiple mechanisms have been proposed to explain the efficiency droop including Auger recombination induced by multi-particle interactions, [4][5][6][7][8] electron leakage due to poor hole injection and electron overflow, 9,10 carrier loss related to reduction or saturation of carrier localization, 11,12 and other processes including the density-activated defect recombination (DADR). 13,14 Some of these factors have been found to be tightly associated with the internal polarization field.…”
mentioning
confidence: 99%
“…There is also evidence that the material quality of the device plays a large role in governing the LED performance. Compositional changes and associated material quality differences in the InGaN for green-wavelength LEDs are believed to contribute to the efficiency drop seen at longer wavelengths [66]. InGaN is a notoriously difficult material to grow due to its low decomposition temperature, a reported miscibility gap [67], and increasing lattice mismatch with GaN as the indium content is increased.…”
Section: A Low Defect Density and Smooth Morphologymentioning
confidence: 99%