1987
DOI: 10.1109/tchmt.1987.1134799
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Investigation of the Reliability of Copper Ball Bonds to Aluminum Electrodes

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Cited by 53 publications
(33 citation statements)
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“…This result was confirmed by the best Rietveld refinement (GOF = 1.27) of the pattern corresponding to MA powder for 6 h ( Figure 2c). In a previous work, Onuki et al [20] reported that the formation of the tetragonal-Al2Cu phase during mechanical milling is due to the negative enthalpy of the mixing of the Al-Cu system. Furthermore, the solubility of the solutes is enhanced with a grain refinement on the nanometer scale.…”
Section: X-ray Diffractionmentioning
confidence: 99%
“…This result was confirmed by the best Rietveld refinement (GOF = 1.27) of the pattern corresponding to MA powder for 6 h ( Figure 2c). In a previous work, Onuki et al [20] reported that the formation of the tetragonal-Al2Cu phase during mechanical milling is due to the negative enthalpy of the mixing of the Al-Cu system. Furthermore, the solubility of the solutes is enhanced with a grain refinement on the nanometer scale.…”
Section: X-ray Diffractionmentioning
confidence: 99%
“…The importance of achieving uniform, void free intermetallic growth in ball-bonded devices has resulted in many studies of gold-aluminium intermetallics [16, and copper-aluminium intermetallics [112][113][114][115][116][117][118][119][120][121][122][123][124][125][126][127]. The presence of voids and correlation of voids with wire pull and shear strength forms the basis of much of the published literature with some more recent exceptions that explore the microstructure [14,41,124].…”
Section: Concepts Of Phase Growth Between Metalsmentioning
confidence: 99%
“…Onuki et al [21] compared reliability performance of gold and copper ball bonds after ageing at temperatures between 120°C and 200°C. Data from that study, in Fig.…”
Section: Reliability Studies 1980-2002mentioning
confidence: 99%