1989
DOI: 10.1063/1.1140775
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Investigations on the consistency of optical constants in the XUV determined by different methods

Abstract: A Monte Carlo method for determining freeenergy differences and transition state theory rate constants

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Cited by 15 publications
(7 citation statements)
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“…demonstrates remarkable agreement between the results of this work and Ref 16,. for both real and imaginary parts of the Pt dielectric function, thus providing an additional validation of our measurements.…”
supporting
confidence: 91%
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“…demonstrates remarkable agreement between the results of this work and Ref 16,. for both real and imaginary parts of the Pt dielectric function, thus providing an additional validation of our measurements.…”
supporting
confidence: 91%
“…Finally, in Fig. 9, we present a comparison of the data from the present work with the data from Birken et al, 16 where the real and imaginary parts of the Pt dielectric function were determined experimentally via reflectance vs. incidence angle measurements using the same method as discussed in Sec. III B of this paper.…”
Section: Compilation Of a New Pt Optical Constant Data Setmentioning
confidence: 92%
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“…Similar investigations have been performed on thin copper films on glass substrates in the range of 50-900 eV [10]. An example of a measurement on Cu at 644 eV photon energy is given in Fig.…”
Section: Examplessupporting
confidence: 57%
“…There is a need to determine the optical properties of many biological moieties and biofunctionalized surfaces in spectral regions ranging from vacuum ultraviolet (VUV) through soft X-ray regions. Techniques such as electron energy loss spectroscopy [4] and [5], ellipsometry [6], the angle dependence of the photoelectric yield [7], and interferometry [8] are used for deriving the optical properties of materials in the VUV through X-ray regions. However the optical properties of protein monolayers, ultrathin organo-silane monolayers (<10 nm) on solid surfaces are not known.…”
Section: Introductionmentioning
confidence: 99%