Compositionally graded Al
x
Ga1-x
N epilayers were coherently grown on AlN single crystal substrates by MOCVD, and polarization-induced doping was determined by contactless sheet resistance and capacitance-voltage measurements on unintentionally doped, n-type graded layers; and by temperature-dependent Hall effect measurements on a Mg doped, p-type graded layer. The room-temperature resistivity, hole concentration, and hole mobility of the p-type layer graded from x= 1.0 to x= 0.36 were 1.2 Ωcm, 4.5x1018 cm-3, and 1.2 cm2/Vs, respectively, which represents a significant improvement over traditional, thermally-activated Mg doping in AlGaN alloys.