Frontiers in Optics 2008/Laser Science XXIV/Plasmonics and Metamaterials/Optical Fabrication and Testing 2008
DOI: 10.1364/oft.2008.jwd6
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Ion Beam Figuring of Strongly Curved Surfaces with a (X, Y, Z) Linear Three-Axes System

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Cited by 20 publications
(9 citation statements)
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“…The thermal source power distribution obtained by simulation is shown in Fig. 4, which is close to the shape of material removal spot obtained by experiment in reference [8]. It can be seen that when the incidence angle θ is 0 °, the distribution is circular, and the x and y directions are symmetrical.…”
Section: Thermal Effect Simulation By Cae Methodssupporting
confidence: 79%
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“…The thermal source power distribution obtained by simulation is shown in Fig. 4, which is close to the shape of material removal spot obtained by experiment in reference [8]. It can be seen that when the incidence angle θ is 0 °, the distribution is circular, and the x and y directions are symmetrical.…”
Section: Thermal Effect Simulation By Cae Methodssupporting
confidence: 79%
“…According to the equations ( 8) and (10), the total power of the heat source and thermal power density distribution could be calculated. Taking the heat source power into equation (8) and equation (10) obtained thermal power density distribution. Then used CAE method to simulate the thermal power density distribution and thermal effect of BK7 glass plane optical component with a diameter of 50mm and a thickness of 5mm during ion beam figuring.…”
Section: Thermal Effect Simulation By Cae Methodsmentioning
confidence: 99%
“…We proposed a method to revise Eq. (5). Except for the damped factor, the extra removal amount is introduced to expand the freedom of solution.…”
Section: B Revised Matrix Equationmentioning
confidence: 99%
“…Ion beam figuring (IBF) avoids these problems because of noncontact figuring. More attention has been paid to this technology during the past two decades [1][2][3][4][5]. The principle of IBF is that the computer controlled fiveaxis moving system moves an ion beam source according to a predefined scanning path and computed dwell time on the optical surface, and the desired removal amounts can be removed by sputtering between the ion beam and the optical material.…”
Section: Introductionmentioning
confidence: 99%
“…Besides these, IOM [8,10] and GFKD [11] have built low-cost three-axis IBF (TIF) systems and obtained successful processing results by using compensation methods. However, to further improve the surface accuracy, especially for the lithography optics, a more accurate algorithm for the IBF process is required, but no clear insight of this research exists so far.…”
Section: Introductionmentioning
confidence: 99%