2006 IEEE Conference on Emerging Technologies - Nanoelectronics
DOI: 10.1109/nanoel.2006.1609693
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Ion-beam modification of high-temperature superconductor thin films for the fabrication of superconductive nanodevices

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Cited by 1 publication
(3 citation statements)
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“…On one hand, n fluxons can be trapped in the normal-conducting core of a CD. At the used irradiation fluence, the material inside a CD is converted to a normal-conducting, defect-rich metal with an almost temperature-independent resistivity of about 1 mΩ cm [5]. Acting as a cylindrical antidot in the superconducting film it can accommodate many fluxons [34,35] due to the large ratio of the diameter of the CD to the in-plane coherence length D/ξ ab (0)∼130, where ξ ab (0)∼1.4 nm [36].…”
Section: Resultsmentioning
confidence: 99%
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“…On one hand, n fluxons can be trapped in the normal-conducting core of a CD. At the used irradiation fluence, the material inside a CD is converted to a normal-conducting, defect-rich metal with an almost temperature-independent resistivity of about 1 mΩ cm [5]. Acting as a cylindrical antidot in the superconducting film it can accommodate many fluxons [34,35] due to the large ratio of the diameter of the CD to the in-plane coherence length D/ξ ab (0)∼130, where ξ ab (0)∼1.4 nm [36].…”
Section: Resultsmentioning
confidence: 99%
“…An array of columnar defect cylinders is created in the YBCO film by masked ion beam irradiation (MIBS). The method is based on our previous observation [5] that irradiation of YBCO with 75 keV He + ions leads to a reduction of the critical temperature T c . At the applied fluence of 3×10 15 cm −2 superconductivity is suppressed, leaving the irradiated regions normal conducting with a resistivity of ρ∼1 mΩ cm that is almost temperature independent between 20 and 310 K. This effect is due to the sensitivity of YBCO to displacements of the weakly-bound chain oxygen atoms [24], while the skeleton of YBCO's crystalline structure still remains intact.…”
Section: Methodsmentioning
confidence: 99%
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