Ion Implantation into Polypropylene

Abstract

The effects of F+ ion implantation on the composition and the structure of oriented polypropylene were studied by optical methods and the Rutherford backscattering (RBS) technique. From the measurement of the contact angle, it was found that the polar component of the surface energy increases with increasing ion fluence. The spectroscopic measurements confirmed the formation of conjugated double bonds and C=O groups in the implanted polypropylene, but not the presence of C-F groups. The oxygen contamination of the polypropylene surface layer was observed in RBS measurements.