Ion-Implanted Diamond Tip for a Scanning Tunneling Microscope

Kaneko, Reizo; Oguchi, S.

doi:10.1143/jjap.29.1854

Cited by 51 publications

(18 citation statements)

References 3 publications

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“…High spatial resolution has been achieved using the f-orbitals of an Sm atom at the apex of a Co 6 Fe 3 Sm tip [25] and p-orbitals of the light-element atoms at the apexes of Be [52] and conductive diamond tips [53][54][55][56][57].…”

Section: Preparation Of Tips and Samples For High-resolution Stm Expementioning

confidence: 99%

High Resolution STM Imaging

Чайка

2015

Surface Science Tools for Nanomaterials Characterization

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Section: Preparation Of Tips and Samples For High-resolution Stm Expementioning

confidence: 99%

High Resolution STM Imaging

Чайка

2015

Surface Science Tools for Nanomaterials Characterization

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“…Diamond tips made conductive by boron ion implantation have been developed to be used in STMs. [5] Samples to be investigated with the STM must be electrically conductive to some degree to allow a few nanoamperes of current to flow from the bias voltage source to the area to be scanned. Nonconductive samples are generally coated with a thin layer of a conductive material to facilitate imaging.…”

Section: The Scanning Tunneling Current Microscopementioning

confidence: 99%

Characterization of Mesoscopic Fluid-like Films with the Novel Shear-force/Acoustic Microscopy

Wang¹

2000

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The shear force mechanism has been utilized as a distance regulation method in scanning probe microscopes. However, the origin of shear force is still unclear. One of the most important reasons for the shear-force damping is due to the presence of a water contamination layer at the sample surface in ambient conditions. Understanding the behavior of such mesoscopic fluid-like films is of significance for studies of not only scanning probe microscopy but also other complex surface phenomena, such as nanotribology, lubrication, adhesion, wetting, and the microfluidity of biological membranes. This thesis investigates, in particular, the dynamics of mesoscopic fluids confined between two sliding solid boundaries. When fluids are constrained to nanometer-sized regions, their physical properties can greatly differ from those displayed by bulk liquids. To gain an insight into the fundamental characteristics of the confined fluid films, we exploit the versatile capabilities of the novel shear-force/acoustic near-field microscope (SANM), which is able to concurrently and independently monitor the effects of the fluid-mediated interactions acting on both the microscope's probe and the sample to be analyzed. Two signals are monitored simultaneously during each experimental cycle: the tuning fork signal, which is the oscillation amplitude of the probe and gives access to the shear force; and acoustic signal, which is detected by an acoustic sensor placed under the sample. Systematic experiments are carried out to investigate the effects of probe geometry, environmental humidity, and chemical properties of probe and sample surface (water affinity: hydrophobicity or hydrophilicity) on the probe-sample interactions, expressing the influence of the fluid-like contamination films. ii ACKNOWLEDGEMENTS I wish to express my warm and sincere thanks to my advisor Prof. Andres H. La Rosa. His wide knowledge and logical way of thinking have been of great value for me. His understanding, encouraging and personal guidance have provided a good basis for the present thesis.

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“…Initial examples of diamond tips have been prepared by fracture, polishing, and grinding of bulk diamond crystals [7][8][9]. However, geometry and surface chemistry are not well defined [10] and in addition expensive diamond crystals are required as starting material.…”

Section: Sfm Probe Fabricationmentioning

confidence: 99%

Novel probes for scanning probe microscopy

Oesterschulze¹

1998

Applied Physics A: Materials Science & Processing

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Cantilever probes for scanning probe microscopy (SPM) applications are fabricated in almost any case from (100) silicon wafers. Although the probes show excellent mechanical properties which make silicon cantilevers appropriate for topography imaging by scanning force microscopy (SFM), modern SPM applications force the search for novel materials with specific material properties which would be of advantage in SPM. In this paper several concepts for SPM probes are described which make use of specific properties of gallium arsenide, diamond and various metals. Different sensor concepts, e.g. in the tip integrated Schottky diode, coplanar waveguide lines integrated on a cantilever probe, etc., are introduced. They are designed for imaging of thermal, electrical, and optical sample surface properties exploiting the unique properties of the above-mentioned materials.Since the invention of scanning force microscopy (SFM) by Binnig et al. in 1986 [1], scanning probe microscopy (SPM) has been demonstrated to be a intriguing tool for highresolution imaging of various physical surface properties [2]. In particular, the cantilever probe concept introduced for SFM has proven to be the most versatile and flexible one available so far. A prerequisite for SFM is the fabrication of probes with reproducible properties, e.g. resonance frequency, force constant, tip shape, and radius of curvature of the tip [3]. Until today the material used for probe fabrication has been almost exclusively (100)-oriented Si (or silicon nitride) because of the well-established micromachining techniques known from semiconductor technology.The most important aspect regarding the potential of SPM is the possibility to integrate various sensors in a single probe. This allows us to image additional physical quantities besides the surface topography. To achieve this aim, novel probe concepts have to be developed and realized by reproducible technological processes. Although the mechanical properties of silicon are quiet excellent with respect to SFM, in modern applications of SPM other probe properties, e.g. electrical, thermal, optical, magnetic, etc., are decisive. For this reason novel materials with specific physical properties have to be considered to optimize probe sensitivity as well as to find new applications.In the first section of the paper it is demonstrated that not only Si, but also GaAs, diamond, and thin metal filmsmaterials with unique physical properties -are appropriate materials. Technological processes will be described which allow batch processing of these materials for probe fabrication. In the second part of the paper the material properties are considered -a significant point for the development of novel active and passive SPM probes.We report on the design and micromachined fabrication of near-field probes for high-frequency scanning electrical force microscopy (HFSEFM), scanning thermal microscopy (SThM), and scanning near-field optical microscopy (SNOM). Probe concepts and fabrication processes presented include the possibilit...

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Ion-Implanted Diamond Tip for a Scanning Tunneling Microscope

Cited by 51 publications

References 3 publications

High Resolution STM Imaging

High Resolution STM Imaging

Characterization of Mesoscopic Fluid-like Films with the Novel Shear-force/Acoustic Microscopy

Novel probes for scanning probe microscopy

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