Ion - Solid Interactions

Giannuzzi, Lucille A.; Prenitzer, B. I.; Kempshall, Brian W.

doi:10.1007/0-387-23313-x_2

Cited by 52 publications

(55 citation statements)

References 19 publications

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“…Ion beams are a method of forming metal plasmas for metal continuum lithographic light sources (Watt et al 2005). Furthermore, the peak intensity was very low for Mo and barely discernible for W when it was run, consistent with the low production efficiency of positive ions with increasing mass since the amount of energy and momentum transferred from the incident gallium ion to the target atom is dependent on the mass ratio of ion and atom (Grehl 2003;Giannuzzi et al 2005). Mo foil was another electrode material used to produce hydrogen continuum radiation in BLP, CfA, and TUe (van Gessel 2009) studies wherein only weak Mo atomic lines were observed in the visible.…”

Section: Possible Artifact: Electrode Emissionmentioning

confidence: 92%

Soft X-ray continuum radiation from low-energy pinch discharges of hydrogen

2013

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Under a study contracted by GEN3 Partners, spectra of high current pinch discharges in pure hydrogen and helium were recorded in the extreme ultraviolet radiation region at the Harvard Smithsonian Center for Astrophysics (CfA) in an attempt to reproduce experimental results published by BlackLight Power, Inc. (BLP) showing predicted continuum radiation due to hydrogen in the 10-30 nm region (Mills, R. L. and Lu, Y. 2010 Hydrino continuum transitions with cutoffs at 22.8 nm and 10.1 nm. Int. J. Hydrog. Energy 35, 8446-8456, doi:10.1016?j.ijhydene.2010.05.098).Alternative explanations were considered to the claimed interpretation of the continuum radiation as being that emitted during transitions of H to lower-energy states (hydrinos). Continuum radiation was observed at CfA in the 10-30 nm region that matched BLP's results. Considering the low energy of 5.2 J per pulse, the observed radiation in the energy range of about 120-40 eV, reference experiments and analysis of plasma gases, cryofiltration to remove contaminants, and spectra of the electrode metal, no conventional explanation was found in the prior or present work to be plausible including contaminants, electrode metal emission, and Bremsstrahlung, ion recombination, molecular or molecular ion band radiation, and instrument artifacts involving radicals and energetic ions reacting at the charge-coupled device and H 2 re-radiation at the detector chamber. Moreover, predicted selective extraordinarily high-kinetic energy H was observed by the corresponding Doppler broadening of the Balmer α line.

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Section: Possible Artifact: Electrode Emissionmentioning

confidence: 92%

Soft X-ray continuum radiation from low-energy pinch discharges of hydrogen

2013

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“…FIB milling of soft materials can result in damage by beam-induced heating and knock-on displacement [21,28,32]. Beam-induced heating occurs over a few tens of nanometers [21] and is negligible for most hard materials [47]. The amount of localized heating also depends on beam current, ion voltage and the thermal conductivity of the sample [21].…”

Section: Discussionmentioning

confidence: 99%

“…1c). This amorphous layer is a consequence of ion implantation, which results from knock-on damage events in which Ga + ions displace atoms in the target material [47].…”

Section: Gallium Contaminationmentioning

confidence: 99%

Evaluating focused ion beam and ultramicrotome sample preparation for analytical microscopies of the cathode layer of a polymer electrolyte membrane fuel cell

Melo

Hitchcock

Berejnov

et al. 2016

Journal of Power Sources

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Optimizing the structure of the porous electrodes of polymer electrolyte membrane fuel cells (PEM-FC) can improve device power and durability. Analytical microscopy techniques are important tools for measuring the electrode structure, thereby providing guidance for structural optimization. Transmission Electron Microscopy (TEM), with either Energy Dispersive X-Ray (EDX) or Electron Energy Loss Spectroscopy (EELS) analysis, and Scanning Transmission X-Ray Microscopy (STXM) are complementary methods which, together, provide a powerful approach for PEM-FC electrode analysis. Both TEM and STXM require thin (50-200 nm) samples, which can be prepared either by Focused Ion Beam (FIB) milling or by embedding and ultramicrotomy. Here we compare TEM and STXM spectromicroscopy analysis of FIB and ultramicrotomy sample preparations of the same PEM-FC sample, with focus on how sample preparation affects the derived chemical composition and spatial distributions of carbon support and ionomer. The FIB lamella method, while avoiding pore-filling by embedding media, had significant problems. In particular, in the FIB sample the carbon support was extensively

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“…The restrictions for the SIMS applications, particularly, in case of simultaneous high layer resolution and high concentration sensitivity or locality, are also established. Processes of emission during bombardment of the surface with ions of inert gases or electronegative active gases are studied the most thoroughly [1][2][3][4][5][6][7][8][9][10][11][12][13][14][15][16][17][18][19].…”

Section: Vt Cherepin Mo Vasylyev Im Makeeva Vm Kolesnik Amentioning

confidence: 99%