2019
DOI: 10.1016/j.jeurceramsoc.2019.05.035
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Irradiation damage in xenon-irradiated α-Al2O3 before and after annealing

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Cited by 14 publications
(6 citation statements)
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“…[14] The intensity reduction of GIXRD diffraction peaks and the obvious intensity drop of Raman modes indicates the ion irradiation induced amorphization of grains with PO 3− 4 tetrahedra distortion to some extent. [15,16,17] However, the crystalline structure remains to be dom-056101-2 inant under the present experimental condition since sharp GIXRD and Raman peaks can be clearly observed after He-ion irradiation. [18] In addition, the defects introduced by He-ion irradiation may reduce the transparency of the present apatite ceramics, in turn lead to the intensity reduction of the Raman modes.…”
mentioning
confidence: 73%
“…[14] The intensity reduction of GIXRD diffraction peaks and the obvious intensity drop of Raman modes indicates the ion irradiation induced amorphization of grains with PO 3− 4 tetrahedra distortion to some extent. [15,16,17] However, the crystalline structure remains to be dom-056101-2 inant under the present experimental condition since sharp GIXRD and Raman peaks can be clearly observed after He-ion irradiation. [18] In addition, the defects introduced by He-ion irradiation may reduce the transparency of the present apatite ceramics, in turn lead to the intensity reduction of the Raman modes.…”
mentioning
confidence: 73%
“…In equation (8), S aF (f ) is Cross spectrum of input signal and output signal; S FF (f ): Self spectrum of input signal.…”
Section: Sweep Frequency Analysismentioning
confidence: 99%
“…An on-site test and numerical simulation were conducted by Choi et al 5 The study opined that the deformation of the base plate and large shear stresses on the anchor bolts causing bolt fracture. The microstructure, metallographic examination and hardness testing of material was analyzed [6][7][8][9] and the authors proposed the main cause of fracture is relevant to complex stresses and treatment process.…”
Section: Introductionmentioning
confidence: 99%
“…Raman scattering spectrometry technology is widely performed to investigate ions implanted SiC, and it can precisely characterize the evolution of lattice damage with an implantation dose, similar to the result obtained via Rutherford backscattering in channeling geometry. [12][13][14][15][16] Furthermore, Raman scattering spectrometry is sensitive to a low defect concentration via the decrease in Raman scattering intensity, broadening of phonon Raman bands, and frequency shift. [12] In this study, confocal Raman scattering spectroscopy and photoluminescence spectrum are employed to investigate the H + 2 -implanted 6H-SiC followed by thermal annealing.…”
Section: Introductionmentioning
confidence: 99%