2018
DOI: 10.1088/1361-6668/aab5fa
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Irreversible degradation of Nb3Sn Rutherford cables due to transverse compressive stress at room temperature

Abstract: In the framework of the Future Circular Collider design study for a 100 TeV circular collider, 16 T superconducting bending magnets based on Nb 3 Sn technology are being developed. A prestress on the conductor during magnet assembly at room temperature (RT) is needed to counteract the Lorentz forces during operation. The superconducting properties of the brittle Nb 3 Sn superconductor are strain sensitive and excessive pre-stress leads to an irreversible degradation of the superconductor. In order to determine… Show more

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Cited by 45 publications
(36 citation statements)
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“…Transverse compressive stress can degrade the superconducting properties of the strain sensitive Nb3Sn [4]. A permanent conductor damage occurs when at room temperature the mechanical stresses exceed about 150 MPa, [5]. Therefore, this stress level must not be exceeded during coil manipulations and magnet assembly.…”
Section: Introductionmentioning
confidence: 99%
“…Transverse compressive stress can degrade the superconducting properties of the strain sensitive Nb3Sn [4]. A permanent conductor damage occurs when at room temperature the mechanical stresses exceed about 150 MPa, [5]. Therefore, this stress level must not be exceeded during coil manipulations and magnet assembly.…”
Section: Introductionmentioning
confidence: 99%
“…Finally, the tool is not limited to study single wires, more complex system can also benefit from its use. The analysis of voids and cracks distribution of Nb 3 Sn Rutherford cables after load test 58 can provide precious information of the most sensible area of the cable and how to improve the cable design. While the study of the deformations of the wires in cable in conduit conductors (CICCs) for fusion application 59 can offer new solutions for the wires twisting pattern in order to optimize such conductors.…”
Section: Discussionmentioning
confidence: 99%
“…The double cable stack has been used for mechanical transverse compression tests at ambient temperature [14,15]. The tomogram of the double cable stack has been acquired in a cable region showing half the indent with a transverse pressure of 230 MPa-tomogram and half of the tomogram is outside the indent ( Fig.…”
Section: Methodsmentioning
confidence: 99%