2019
DOI: 10.1007/s10904-019-01285-y
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Jet Nebulizer Sprayed WO3-Nanoplate Arrays for High-Photoresponsivity Based Metal–Insulator–Semiconductor Structured Schottky Barrier Diodes

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Cited by 42 publications
(12 citation statements)
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“…The current transport mechanism of p-CuO@CuS/n-Si diode was explained by the Thermionic Emission (TE) theory [ 43 ]: n is Ideality factor, K B is Boltzmann constant, T is temperature in kelvin, R s is series resistance, I o is reverse saturation current and V is applied voltage. The reverse saturation current ( ) calculated from the following equation [ 44 ]. here A is area of contact and A* is the Richardson constant, zero bias barrier height.…”
Section: Resultsmentioning
confidence: 99%
“…The current transport mechanism of p-CuO@CuS/n-Si diode was explained by the Thermionic Emission (TE) theory [ 43 ]: n is Ideality factor, K B is Boltzmann constant, T is temperature in kelvin, R s is series resistance, I o is reverse saturation current and V is applied voltage. The reverse saturation current ( ) calculated from the following equation [ 44 ]. here A is area of contact and A* is the Richardson constant, zero bias barrier height.…”
Section: Resultsmentioning
confidence: 99%
“…The prepared WO 3 and Sn–WO 3 precursor solutions of 3 mL were deposited separately on the cleaned p-Si substrates (1 cm × 1 cm) by the jet nebulizer spray pyrolysis technique with different concentrations of Sn (0, 4, 8, and 12 wt.%) the copper (Cu) metal contact was coated on the Sn–WO 3 /p-Si using dc sputtering (Model Name: HIND high vacuum-PS 2000) with 4 mm diameter and 500 nm thickness. The instrument details and deposition conditions of the metal contacts were mentioned in their previous work [ 36 , 37 ]. The Sn-WO 3 /p-Si diode showed a positive light response of high reverse saturation current under illumination [ 38 ].…”
Section: Photodetectormentioning
confidence: 99%
“…The WO 3 microstructures grown by maintaining the temperature at 950 °C and increasing the oxygen concentration (Figure c) exhibit an upward shift in the voltage as the temperature increases, which could be due to Joule heating. Interestingly, the increase in current flow with an increase in temperature is not maintained for samples grown at low oxygen concentrations, while for samples grown at high oxygen concentrations, the microstructures follow the conventional route . This may be due to the grain distribution, wherein low-oxygen-concentration growth results in large grains with less grain boundaries, leading to reduced traps for charge transport.…”
Section: Resultsmentioning
confidence: 98%
“…Interestingly, the increase in current flow with an increase in temperature is not maintained for samples grown at low oxygen concentrations, while for samples grown at high oxygen concentrations, the microstructures follow the conventional route. 30 This may be due to the grain distribution, wherein low-oxygen-concentration growth results in large grains with less grain boundaries, leading to reduced traps for charge transport. High-oxygenconcentration growth is accompanied by more grain boundaries and poorly connected microstructures, which can reduce the current flow.…”
Section: ■ Results and Discussionmentioning
confidence: 99%