Kelvin Probe Force Microscopy in Nanoscience and Nanotechnology

Luo, Da; Sun, Hao; Li, Yudong

doi:10.1007/978-3-662-44551-8_4

Cited by 7 publications

(6 citation statements)

References 90 publications

(100 reference statements)

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“…According to the equation dF/dz = −4kΔj/(πQ), the electrostatic force gradient dF/dz of the mineral surface can be obtained [45] (The vibration amplitudes of the cantilevers are approximately 0.04, 0.09, and 0.06 mV for kaolinite, montmorillonite and illite, respectively), the phase shift images of the three clay minerals can be transformed into those of the surface electric field force gradient distribution (figure 5). Moreover, the average value of the electric field force gradient in the relatively flat areas (basal surfaces) of the three clay mineral surfaces are calculated (table 2).…”

Section: Electrostatic Force Microscopy Of Clay Mineralsmentioning

confidence: 99%

“…In addition, the surface electric field intensity (E = ΔV/d) can be calculated based on the tip-sample distance (d, set to 80 nm during testing) and the potential difference (ΔV) measured by KPFM when the tip voltage is 0 [45]. Thus, the surface electric field intensity distributions of the three minerals (figure 7) and the average electric field intensities of the flat surface areas (table 3) are obtained.…”

Section: Kelvin Probe Microscopy Of Clay Mineralsmentioning

confidence: 99%

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Probing the surface electrical properties of clay minerals with electrostatic force microscopy and kelvin probe force microscopy

Qin,

Nie,

et al. 2024

Mater. Res. Express

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Many surface processes of clay minerals require in-depth understanding of their surface electrical properties, such as surface charge density, surface potential distribution, etc. In this paper, electrostatic force microscopy (EFM) and Kelvin probe force microscopy (KPFM) were used to study the surface charge densities, surface potentials, electric field intensities, and electric field force gradients of three common clay minerals: kaolinite, montmorillonite, and illite. The properties were directly imaged, and the average surface permanent charge densities of kaolinite, montmorillonite, and illite were obtained to be -0.0060, -2.136, and -5.456 μC m-2, respectively. In addition, a good linear relationship was found between the surface charge densities obtained by KPFM and the layer charges calculated from the mineral chemical formulas of three clay minerals.

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Section: Electrostatic Force Microscopy Of Clay Mineralsmentioning

confidence: 99%

Section: Kelvin Probe Microscopy Of Clay Mineralsmentioning

confidence: 99%

Probing the surface electrical properties of clay minerals with electrostatic force microscopy and kelvin probe force microscopy

Qin,

Nie,

et al. 2024

Mater. Res. Express

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“…Transistors. KPFM method can be also applied to the optimization and characterization of the surface potential of material surfaces for developing electronic devices, including semiconductors and field-effect transistors (FETs) [93,94].…”

Section: Electrical Properties Characterization Of Field-effectmentioning

confidence: 99%

“…Perspective. As we have already discussed above, many researcher have reported various applications of KPFM ranging from material analysis to quantitative estimation of electrical properties of various devices [32,94]. Because of KPFM's versatility for electrical measurement, KPFM could provide some important information in regard to distribution of surface potentials and surface potential densities of nanobiomaterials.…”

Section: Biomolecule Detection On a Patterned Carbon Nanotubementioning

confidence: 99%

Surface Potential Analysis of Nanoscale Biomaterials and Devices Using Kelvin Probe Force Microscopy

Lee

et al. 2016

Journal of Nanomaterials

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In recent years, Kelvin probe force microscopy (KPFM) has emerged as a versatile toolkit for exploring electrical properties on a broad range of nanobiomaterials and molecules. An analysis using KPFM can provide valuable sample information including surface potential and work function of a certain material. Accordingly, KPFM has been widely used in the areas of material science, electronics, and biomedical science. In this review, we will briefly explain the setup of KPFM and its measuring principle and then survey representative results of various KPFM applications ranging from material analysis to device analysis. Finally, we will discuss some possibilities of KPFM on whether it is applicable to various sensor systems. Our perspective shed unique light on how KPFM can be used as a biosensor as well as equipment to measure electrical properties of materials and to recognize various molecular interactions.

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“…There are mainly focus on five KFM applications including surface charge detection, work function and doping level study, charge transfer study, FETs, and atomic resolution KFM. 28 For the DTTs surface on HOPG substrate, the charge transfer between the DTTs aggregates and HOPG substrate was discussed. 5(c'), respectively.…”

mentioning

confidence: 99%

Study on aggregation and electric properties in the micro-region of functionalized dithieno[2, 3-b: 3′, 2′-d]thiophene (DTT) oligomers

et al. 2016

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Three kinds of 2,5,-diphenyl-dithienol[2, 3-b: 3′, 2′-d]thiophene (DP-DTT), 2,5,-distyryl-dithienol[2, 3-b: 3′, 2′-d]thiophene (DEP-DTT) and 2,5,-thienyl-dithienol[2, 3-b: 3′, 2′-d]thiophene (DET-DTT) micro-region structure and electronic properties were studied. Thin films of these functionalized DTT oligomers were prepared in a one-step drop-casting deposition onto highly oriented pyrolytic graphite substrates. The surface structure of these films was characterized by atomic force microscopy (AFM). Conducting probe atomic force microscope (C-AFM) and Kelvin probe force microscope (KFM) were both used to characterize the electronic transport behavior and surface potential distribution. The substituents of DTT oligomers can greatly affect their aggregation and the hopping conductance mechanism was used to explain the Au-DTTs-HOPG junctions. KFM investigation revealed that these oligomers with different substituents have different highest occupied molecular orbital energy levels. The corresponding theoretical analysis reveals similar result to KFM characterization. The I-V results indicated that the aggregates of molecules were the dominating factor to their micro-region electrical transport.

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Kelvin Probe Force Microscopy in Nanoscience and Nanotechnology

Cited by 7 publications

References 90 publications

Probing the surface electrical properties of clay minerals with electrostatic force microscopy and kelvin probe force microscopy

Probing the surface electrical properties of clay minerals with electrostatic force microscopy and kelvin probe force microscopy

Surface Potential Analysis of Nanoscale Biomaterials and Devices Using Kelvin Probe Force Microscopy

Study on aggregation and electric properties in the micro-region of functionalized dithieno[2, 3-b: 3′, 2′-d]thiophene (DTT) oligomers

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