2002
DOI: 10.1021/nl025523e
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Kelvin Probe Force Microscopy of Periodic Ferroelectric Domain Structure in KTiOPO4 Crystals

Abstract: Mono-and periodically poled domain structures of ferroelectric KTiOPO 4 crystals have been studied by Kelvin probe force microscopy. This scanning probe method has allowed us to image the domain structure using a contact potential difference contrast between 180°ferroelectric domains. The measured contact potential difference between adjacent domains showed that the screening in the KTiOPO 4 crystals is provided by the highly mobile potassium ions. The screening charge density distribution and the resulting De… Show more

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Cited by 32 publications
(33 citation statements)
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“…[63][64][65][66][67][68][69] However, the nature and quantitative mechanisms of the observed signal remained highly uncertain. In parallel, several groups explored ferroelectric domain imaging using Kelvin Probe Force Microscopy (KPFM) and similar techniques, 29,30,[37][38][39][71][72][73] which are variants of non-contact SPM techniques sensitive to long-range electrostatic interactions. Early successes included visualization of domain structures, with the contrast attributed directly to the stray electrostatic field above the surface due to (unscreened) polarization bound charges.…”
Section: Iia Basic Pfmmentioning
confidence: 99%
“…[63][64][65][66][67][68][69] However, the nature and quantitative mechanisms of the observed signal remained highly uncertain. In parallel, several groups explored ferroelectric domain imaging using Kelvin Probe Force Microscopy (KPFM) and similar techniques, 29,30,[37][38][39][71][72][73] which are variants of non-contact SPM techniques sensitive to long-range electrostatic interactions. Early successes included visualization of domain structures, with the contrast attributed directly to the stray electrostatic field above the surface due to (unscreened) polarization bound charges.…”
Section: Iia Basic Pfmmentioning
confidence: 99%
“…37 Measurements of potential screening on BaTiO 3 and charged grain boundaries in SrTiO 3 indicate that the lateral resolution is limited to ~300 nm related to the non-contact nature of the measurements.…”
Section: E Electrostatic State Of Surfacementioning
confidence: 99%
“…The elec- tron affinity at a semiconductor surface is a function of the surface dipole induced by various surface effects such as surface termination, surface reconstruction, surface orientation, local stoichiometry changes, atomic steps, and adsorbates. 2,15 We are suggesting that for a ferroelectric semiconductor, the screening of the polarization charges by adsorption of charged molecules or ions on a surface (external screening) will give rise to an additional surface dipole 1,6,16,17 and result in a variation in the electron affinity. This effect is modeled schematically in Fig.…”
Section: Polarization-dependent Electron Affinity Of Linbo 3 Surfacesmentioning
confidence: 99%