2005
DOI: 10.1088/0022-3727/38/23/010
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Kinetic Monte Carlo simulation of deposition of energetic copper atoms on a Cu(001) substrate

Abstract: A three-dimensional (3D) energy-dependent kinetic Monte Carlo technique is developed to simulate thin film growth with deposition of energetic atoms. We incorporate the effects of the incident kinetic energy and the incident angle of atomic fluxes into the conventional vapour phase deposition model. The atom reflection, the biased diffusion and the athermal diffusion caused by the incident energy and the incident angle are included in our study. We simulate the film morphology and the surface roughness of homo… Show more

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Cited by 17 publications
(9 citation statements)
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“…Ellipsometry shows the roughness of the sample decreases with increasing magnitude of the RF bias and is generally larger for low oxygen partial pressure (Table ). This is attributed to increased adparticle diffusion at higher biases and formation of denser, smoother films …”
Section: Resultsmentioning
confidence: 99%
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“…Ellipsometry shows the roughness of the sample decreases with increasing magnitude of the RF bias and is generally larger for low oxygen partial pressure (Table ). This is attributed to increased adparticle diffusion at higher biases and formation of denser, smoother films …”
Section: Resultsmentioning
confidence: 99%
“…This is attributed to increased adparticle diffusion at higher biases and formation of denser, smoother films. 42 Ib. Preferred Orientation.…”
Section: ■ Introductionmentioning
confidence: 99%
“…When the kinetic energy of incident particles was low the columnar morphology of nanocoating surface were separated by voids resulting a rough surface due to less ability of particles to move onto the surface [18]. However, the energy also was affected by scattering process.…”
Section: Discussionmentioning
confidence: 99%
“…There has been a substantial amount of effort focused on the study of submonolayer deposition, island formation and growth, and island-island coalescence [5,18,19,20,21,22], while for multilayer growth several questions remain open [23,24,25,26,27]. Typically, either a detailed approach is considered, which attempts to make no assumptions, or as few as possible [9,28,29,30,31,32,33], or simple models are developed, where mechanisms are restricted to the most relevant ones [34,35,36,37,38,39,40,41]. In this work, we adopt the latter approach, which allows us to better understand the relevance of each process.…”
Section: Introductionmentioning
confidence: 99%