“…Because of its various extraordinary properties, such as high electrical resistance, chemical stability, and mechanical strength and hardness, [ 8,9 ] atomically smooth surface free of dangling bonds and charge traps, [ 10 ] and only 1.7% lattice mismatch to graphene, [ 11 ] h-BN can be served as more suitable dielectric substrate for fi eld effect transistors than traditional insulated substrate of SiO 2 /Si. [10][11][12][13][14] Previous reports have shown considerable improvement in the preparation of h-BN on metal substrates, such as Cu, [ 9,[15][16][17][18][19][20][21][22][23][24] Ni, [ 25,26 ] Pt, [27][28][29] Ru, [ 30 ] and Co [ 31 ] via the chemical vapor deposition (CVD). By using the continuous single-layer h-BN fi lm as back gate dielectric, the electronic performance of graphene and graphene-like materials were obviously improved.…”