2020 IEEE 70th Electronic Components and Technology Conference (ECTC) 2020
DOI: 10.1109/ectc32862.2020.00144
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Large-body-sized Glass-based Active Interposer for High-Performance Computing

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Cited by 19 publications
(3 citation statements)
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“…By contrast, current silicon interposers and mold compound embedded packages are not able to compete in terms of I/O pitch, bandwidth, and reliably owing to thermo-compression bonding assembly and die shift induced limits [19]. More recently, several 3D glassbased package architectures for HPC applications have been demonstrated in [80], [81], [82]. The advanced 3D package concept as illustrated in Fig.…”
Section: Packaging and Interposer Solutionsmentioning
confidence: 99%
See 1 more Smart Citation
“…By contrast, current silicon interposers and mold compound embedded packages are not able to compete in terms of I/O pitch, bandwidth, and reliably owing to thermo-compression bonding assembly and die shift induced limits [19]. More recently, several 3D glassbased package architectures for HPC applications have been demonstrated in [80], [81], [82]. The advanced 3D package concept as illustrated in Fig.…”
Section: Packaging and Interposer Solutionsmentioning
confidence: 99%
“…7(f)) which land from the thin build-up layers directly onto the chip pads [85], [86], [19], [81], [88]. Via-in-via through package interconnects [26], [80], [81] and microviaenhanced organic RDLs on glass core substrates [114], [115], [116] were also reported for future HPC and wireless communications systems.…”
Section: Components a Transmssion Lines And Interconnectsmentioning
confidence: 99%
“…The ring- and cavity-type heat spreaders are designed to improve the warpage behavior of the concerned vehicle by the high stiffness of the heat spreader. A design concept of glass panel embedding technology was proposed; it embeds the concerned chip in the glass substrates with plated RDL and TGV to achieve a trace below 2 μm by adopting polymer RDL, providing a solution for warpage control [ 38 ]. Cu bridge design improves upon conformal Cu-filled via structures and has superior reliability against thermal stress [ 39 ].…”
Section: Introductionmentioning
confidence: 99%