2019
DOI: 10.1002/smll.201904116
|View full text |Cite
|
Sign up to set email alerts
|

Large‐Scale Growth and Field‐Effect Transistors Electrical Engineering of Atomic‐Layer SnS2

Abstract: 2D layers of metal dichalcogenides are of considerable interest for high‐performance electronic devices for their unique electronic properties and atomically thin geometry. 2D SnS2 nanosheets with a bandgap of ≈2.6 eV have been attracting intensive attention as one potential candidate for modern electrocatalysis, electronic, and/or optoelectronic fields. However, the controllable growth of large‐size and high‐quality SnS2 atomic layers still remains a challenge. Herein, a salt‐assisted chemical vapor depositio… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
3
2

Citation Types

4
63
2

Year Published

2020
2020
2024
2024

Publication Types

Select...
5

Relationship

0
5

Authors

Journals

citations
Cited by 73 publications
(69 citation statements)
references
References 56 publications
4
63
2
Order By: Relevance
“…Convincingly, a single Raman peak at 314 cm −1 , which represents A g 1 is observed for both the original and the O 2 ‐plasma‐treated SnS 2 flake and was similar to those previously reported. [ 2,22 ] The XRD pattern of SnS 2 can be attributed to the hexagonal structure (JCPDS PDF number 23–0677). Therefore, the results exhibit a single crystal SnS 2 with c‐ axis preferential orientation (Figure S1, Supporting Information).…”
Section: Resultsmentioning
confidence: 99%
See 2 more Smart Citations
“…Convincingly, a single Raman peak at 314 cm −1 , which represents A g 1 is observed for both the original and the O 2 ‐plasma‐treated SnS 2 flake and was similar to those previously reported. [ 2,22 ] The XRD pattern of SnS 2 can be attributed to the hexagonal structure (JCPDS PDF number 23–0677). Therefore, the results exhibit a single crystal SnS 2 with c‐ axis preferential orientation (Figure S1, Supporting Information).…”
Section: Resultsmentioning
confidence: 99%
“…[ 21 ] In an ambient condition, the extracted carrier mobility from the treated SnS 2 FET is one of the highest reported so far. [ 1,22 ] Figure 3b shows the distinctive gating response of the original and the O 2 ‐plasma‐treated SnS 2 FET between −40 and 40 V at V ds = 1 V, they both exhibit n‐type channel behavior and the threshold voltage decreases after the plasma treatment which indicates faster response. Furthermore, Figure 3c shows typical I ds – V ds curves of the device under dark with improved dark currents after plasma treatment.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…[ 12,13 ] It crystallizes in the CdI 2 ‐type 2D structure (1T phase) similar to many TMDCs [ 12,14 ] and has a fairly large, indirect band gap of approximately 2.2 eV in bulk [ 13,15 ] and 2.4−2.6 eV as a monolayer. [ 15,16 ] SnS 2 has already shown performance comparable to the benchmark 2D semiconductor, MoS 2 , in applications such as FETs [ 9,12,17–19 ] and photodetectors. [ 12,20 ] Furthermore, possible reduction in short‐channel leakage [ 20,21 ] due to the larger, indirect band‐gap of SnS 2 and higher predicted mobility [ 22 ] compared to MoS 2 make SnS 2 a favorable material for electronics.…”
Section: Introductionmentioning
confidence: 99%
“…Thus far, CVD has been mostly used to produce high‐quality, isolated few‐layer flakes of SnS 2 at 450–700 °C. [ 16,18,32,33 ] CVD of continuous SnS 2 films was demonstrated recently, but films below 3–4 nm in thickness remained discontinuous and even 15 nm thick films contained some holes. [ 34,35 ] ALD has been used to deposit continuous SnS 2 films with thicknesses from approximately two up to tens of monolayers.…”
Section: Introductionmentioning
confidence: 99%