2013
DOI: 10.1016/j.egypro.2013.07.331
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Laser Ablation of Dielectric Layers and Formation of Local Al-BSF in Dielectric back Passivated Solar Cells

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Cited by 12 publications
(8 citation statements)
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“…In general, laser doping using liquid or solid B as the B source and nanosecond (NS) laser result in doped regions with junction depths at the order of 2 lm or less (Hallam et al, 2015;Bounaas et al, 2013;Kray et al, 2008;Kim et al, 2014a;Green, 2015). Traditional B sources require a high energy to melt the Si substrate and a long time to maintain B diffusion; hence, NS laser is the best choice.…”
Section: Ps Laser Dopingmentioning
confidence: 99%
“…In general, laser doping using liquid or solid B as the B source and nanosecond (NS) laser result in doped regions with junction depths at the order of 2 lm or less (Hallam et al, 2015;Bounaas et al, 2013;Kray et al, 2008;Kim et al, 2014a;Green, 2015). Traditional B sources require a high energy to melt the Si substrate and a long time to maintain B diffusion; hence, NS laser is the best choice.…”
Section: Ps Laser Dopingmentioning
confidence: 99%
“…In PERC and Al-BSF solar cells, direct laser drilling of local openings in Al, AlO x , SiO 2 /SiN x , and AlO x /SiN x stack layers had been previously attempted with some laser-induced defects and passivation damages. Such local openings can be made by selective laser patterning of SiN x in H 3 PO 4 , AlO x and Al in KOH, and SiO 2 in KOH [65][66][67]. Wu et al showed the KOH etching process for bulk micromachining of 100 mm diameter (100) silicon substrate, SiO 2 , and SiN x passivation layers for the fabrication of high-temperature pressure sensors based on polycrystalline and single-crystalline 3C-SiC piezo-resistors [68], which are also achievable by selectively chemical-etching by laser patterning in KOH and H 3 PO 4 solutions.…”
Section: Direct Applicability Of Lhice Process To Diverse Semiconduct...mentioning
confidence: 99%
“…A more direct approach for front-surface metallisation can be achieved by UV laser ablation of a silicon nitride ARC for cells that that use this material as the ARC. [41][42][43][126][127][128][129][130] The process for inorganic layer ablation is similar to that described above for polymer ablation. Although a much simpler process than that described by Chaudhari and Solanki, some silicon damage can occur and so direct ARC ablation typically results in some loss in the pseudo fill factor if the cell's p-n junction is too shallow.…”
Section: Laser Ablationmentioning
confidence: 99%