Laser-assisted atom probe tomography investigation of magnetic FePt nanoclusters: First experiments

Folcke, Emeric; Lardé, R.; Breton, J.M. Le; Gruber, M.; Vurpillot, F.; Shield, Jeffrey E.; Rui, X.; Patterson, M.

doi:10.1016/j.jallcom.2011.11.134

Cited by 15 publications

(10 citation statements)

References 16 publications

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“…22 Encapsulation of nanoparticles deposited on a flat substrate and FIB lift-out allowed improving the data quality, but have been implemented so far in a few instances only. [23][24][25][26][27] In this study, we show that IGC is actually an efficient method for the manufacturing of identical nanoparticle-containing specimens intended for HR-STEM/EDX and APT analyses.…”

Section: Introductionmentioning

confidence: 73%

Atom Probe Tomography of Au–Cu Bimetallic Nanoparticles Synthesized by Inert Gas Condensation

et al. 2019

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The Inert Gas Condensation method (IGC) produces multimetallic nanoparticles in a metastable state that may exhibit heterogeneities of size, structure and composition. The deposition of IGC-fabricated nanoparticles on substrates allows for a detailed characterization by combination of aberration-corrected transmission electron microscopy (TEM) and Atom Probe Tomography (APT). Multiple particle monitoring and high-resolution TEM give access to the size distribution of Au-Cu nanoparticles (<10nm in diameter, bimodal distribution). TEM and APT show that the alloying between Cu and Au may stabilize the Ih structure for smaller particles (<4nm). Combining HR-STEM/EDX and 3D composition analysis by APT reveals that an excess of Cu may be present in a shell around the larger particles (>7nm), while Cu is more randomly distributed in smaller particles.

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Section: Introductionmentioning

confidence: 73%

Atom Probe Tomography of Au–Cu Bimetallic Nanoparticles Synthesized by Inert Gas Condensation

et al. 2019

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“…They are generally incompatible with analysis by APT because the NPs are either too small to be individually transplanted and sharpened into an APT specimen, or because empty, voided regions contained within groups of NPs, or other open-space structures, are distributed in such a way that an APT tip cannot be made without being compromised by these structural defects (Larson et al, 2015). A few specimen preparation strategies have been reported in the literature (Folcke et al, 2012; Greene et al, 2012; Gordon et al, 2013; Felfer et al, 2014, 2015; Heck et al, 2014; Larson et al, 2015; Perea et al, 2016), but we will focus on two general strategies in this review.…”

Section: Other Preparation Challengesmentioning

confidence: 99%

“…The first strategy takes sub-monolayer deposits of particles on a substrate and covers them with a matrix or capping material (deposit and cover) (Folcke et al, 2012; Heck et al, 2014; Felfer et al, 2015). This covering process can include methods such as atomic layer deposition (ALD), where a space-filling structure is grown around deposited or grown NPs (Larson et al, 2015).…”

Section: Other Preparation Challengesmentioning

confidence: 99%

Modern Focused-Ion-Beam-Based Site-Specific Specimen Preparation for Atom Probe Tomography

Prosa

Larson

2017

Microsc Microanal

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Approximately 30 years after the first use of focused ion beam (FIB) instruments to prepare atom probe tomography specimens, this technique has grown to be used by hundreds of researchers around the world. This past decade has seen tremendous advances in atom probe applications, enabled by the continued development of FIB-based specimen preparation methodologies. In this work, we provide a short review of the origin of the FIB method and the standard methods used today for lift-out and sharpening, using the annular milling method as applied to atom probe tomography specimens. Key steps for enabling correlative analysis with transmission electron-beam backscatter diffraction, transmission electron microscopy, and atom probe tomography are presented, and strategies for preparing specimens for modern microelectronic device structures are reviewed and discussed in detail. Examples are used for discussion of the steps for each of these methods. We conclude with examples of the challenges presented by complex topologies such as nanowires, nanoparticles, and organic materials.

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“…These can be summed up into two groups, namely those based on electrophoresis of nanoparticles onto pre-sharpened tips ready for APT analyses (Tedsree et al, 2011; Yu et al, 2012; Li et al, 2014) and those based on embedding nanoparticles in a medium followed by focused-ion-beam (FIB) milling of the composite material to APT specimens. To embed the nanoparticles in a metallic matrix, electron beam-assisted Pt deposition (Xiang et al, 2013; Yang et al, 2015), sputter deposition (Folcke et al, 2012; Felfer et al, 2014), and the usage of low-melting-point fusible alloys (Kim et al, 2019) have been proposed. Although these recent attempts have proved to be clearly applicable to specific material systems, further developments in the preparation techniques for APT specimens are still needed.…”

Section: Introductionmentioning

confidence: 99%

Atom Probe Tomography Investigations of Ag Nanoparticles Embedded in Pulse-Electrodeposited Ni Films

et al. 2021

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Laser-assisted atom probe tomography investigation of magnetic FePt nanoclusters: First experiments

Cited by 15 publications

References 16 publications

Atom Probe Tomography of Au–Cu Bimetallic Nanoparticles Synthesized by Inert Gas Condensation

Atom Probe Tomography of Au–Cu Bimetallic Nanoparticles Synthesized by Inert Gas Condensation

Modern Focused-Ion-Beam-Based Site-Specific Specimen Preparation for Atom Probe Tomography

Atom Probe Tomography Investigations of Ag Nanoparticles Embedded in Pulse-Electrodeposited Ni Films

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