1970
DOI: 10.1063/1.1658600
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Lattice parameters of ZnO from 4.2° to 296°K

Abstract: The temperature dependence of the lattice parameters of ZnO was measured by x-ray powder-diffraction methods. Retrograde behavior was found to occur perpendicular to the c axis at 93°K. Lattice parameters at 4.2°K were a0=3.24826±0.00015Å, c0=5.2033±0.0018 Å. These results are compared with those for some other II-VI compounds.

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Cited by 189 publications
(92 citation statements)
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“…The subset databases are identified as follows: r S(13): thirteen semiconductors that have been widely used for testing density functionals: C, Si, Ge, SiC, BP, BAs, AlP, AlAs, β-GaN, GaP, GaAs, InP, InAs. For twelve of the lattice constants in S(13) we used the correction for ZPAE estimated by Hao et al, while the corrected experimental datum for InSb was taken from Schimka et al 25 For the other semiconductors we corrected the data from the experimental references provided by Heyd et al 4 and the ZnO datum 32 by estimating the ZPAE based on a statistical analysis of previous studies. 22,25,26 We noticed that the value of the ZPAE correction for semiconductors with B3 structures is on average −0.010 Å (with the largest deviation being within 0.002 Å), and we applied this estimate of the correction to the remaining uncorrected experimental data of semiconductors with B3 structures.…”
Section: Test Set and Computational Detailsmentioning
confidence: 99%
See 1 more Smart Citation
“…The subset databases are identified as follows: r S(13): thirteen semiconductors that have been widely used for testing density functionals: C, Si, Ge, SiC, BP, BAs, AlP, AlAs, β-GaN, GaP, GaAs, InP, InAs. For twelve of the lattice constants in S(13) we used the correction for ZPAE estimated by Hao et al, while the corrected experimental datum for InSb was taken from Schimka et al 25 For the other semiconductors we corrected the data from the experimental references provided by Heyd et al 4 and the ZnO datum 32 by estimating the ZPAE based on a statistical analysis of previous studies. 22,25,26 We noticed that the value of the ZPAE correction for semiconductors with B3 structures is on average −0.010 Å (with the largest deviation being within 0.002 Å), and we applied this estimate of the correction to the remaining uncorrected experimental data of semiconductors with B3 structures.…”
Section: Test Set and Computational Detailsmentioning
confidence: 99%
“…We trimmed the SC/40 database by deleting seven of the semiconductors for which there are no experimental values for either the lattice constant, the bandgap, or both and three semiconductors for which we had serious difficulties in obtaining converged self-consistent field solutions, even using a very high number of k points. This leaves 30 semiconductors, to which we added ZnO data 32,33 because of its importance in applications, [34][35][36][37][38] and strong theoretical interest, [39][40][41][42][43] for a total of 31 semiconductors. We then created two databases, SLC34 with 34 semiconductor lattice constants and SBG31 with 31 semiconductor bandgaps.…”
Section: Test Set and Computational Detailsmentioning
confidence: 99%
“…Crystalline lattice of ZnO in the most common wurtzite-type phase is essentially anisotropic [9,10,11] that is reflected in its piezoelectric [12,13] and pyroelectric [14] properties. The wurtzite structure has a hexagonal unit cell with two lattice parameters, a and c, and belongs to the space group of P 6 3 mc (No.…”
Section: Introductionmentioning
confidence: 99%
“…The temperature-related frequency shifts between 6 K and 300 K were: 1.6 cm −1 , 0.5 cm −1 , and 4 cm −1 , for A 1 (TO), E 1 (TO), and LO, respectively. The thermal frequency change coefficients φ = d ln(ω)/dT near the room temperature were calculated: [11], one can obtain the Grüneisen parameter: γ = φ/β. These parameters were 2, 0.1, 1.1, and 3.2 for A 1 (TO), E 1 (TO), E H 2 , and LO, respectively.…”
Section: Measurements and Discussionmentioning
confidence: 99%