2020
DOI: 10.1007/s11277-020-07765-6
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Leakage Reduction in 18 nm FinFET based 7T SRAM Cell using Self Controllable Voltage Level Technique

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Cited by 23 publications
(13 citation statements)
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“…Statistics affect both delay deviations. To evaluate delay variability, 2000 Monte Carlo simulations are undertaken [ 3 ].…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…Statistics affect both delay deviations. To evaluate delay variability, 2000 Monte Carlo simulations are undertaken [ 3 ].…”
Section: Resultsmentioning
confidence: 99%
“…Due to its instability, systems that use conventional SRAM like primary memory or cache have quite a longer startup time. Nonvolatile memory can assist minimize startup time and energy consumption [ 3 , 4 ]. It is possible that a CMOS Memristor-based SRAM cell would have been an efficient circuit component that would have allowed standard memory cells to sustain data despite the power being disconnected.…”
Section: Introductionmentioning
confidence: 99%
“…FinFETs are vertical channel, multiple gates, low dimension, high performance FET [21][22]. FinFET has enormous potential to suppress leakage current and improve transistor drive capabilities [23][24]. FinFETs are also compatible with CMOS logic and memory design.…”
Section: Simulation Resultsmentioning
confidence: 99%
“…Here we generate a minimum or maximum voltage supply, and minimum or maximum ground voltage for increasing the speed of operation. When there is a switching among standby mode and active mode here the circuit has three levels of design such as lower SVL, upper SVL and a mixture of both lower and upper SVL [23][24].…”
Section: Proposed Self-controllable Voltage Level Technique (Svl)mentioning
confidence: 99%