2007
DOI: 10.1109/tns.2007.909910
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LED Technologies for Optocouplers: Fundamental Issues and Hardness Assurance

Abstract: Radiation damage is examined for several different LED technologies used in optocouplers, including those with wavelengths near 700 nm that are used in radiation-tolerant devices, and have not been widely studied. Forward diode characteristics and reverse recovery time measurements are examined as potential parameters for hardness assurance.

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Cited by 6 publications
(1 citation statement)
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“…In optocouplers the input electrical signal is applied to a photoemitter (typically the LED is used to this end) changing this signal to the optical signal, which reaches by a dielectric waveguide the output device-a photodetector, (e.g. the bipolar phototransistor), and this output component transforms the optical signal to its original electrical form [11,12].…”
Section: Introductionmentioning
confidence: 99%
“…In optocouplers the input electrical signal is applied to a photoemitter (typically the LED is used to this end) changing this signal to the optical signal, which reaches by a dielectric waveguide the output device-a photodetector, (e.g. the bipolar phototransistor), and this output component transforms the optical signal to its original electrical form [11,12].…”
Section: Introductionmentioning
confidence: 99%