1980
DOI: 10.1016/0039-6028(80)90026-6
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LEED analysis of Si(111)−(7 × 7) surface models

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1981
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Cited by 19 publications
(2 citation statements)
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“…For a reasonably thorough multiple scattering (dynamical) calculation, the present limit is only a few per cent of the above figure. Hence LEED analysis has proceeded using kinematical (single scattering) analysis, which, despite its shortcomings, was still sufficient (Miller and Haneman 1979, Miller et al 1980 to show the incompatibility with experiment of many proposed models. In the last few years more LEED analysis has been carried out and also high-energy transmission electron diffraction of very thin specimens.…”
Section: The Si(ll1) 7 X 7 Surfacementioning
confidence: 99%
“…For a reasonably thorough multiple scattering (dynamical) calculation, the present limit is only a few per cent of the above figure. Hence LEED analysis has proceeded using kinematical (single scattering) analysis, which, despite its shortcomings, was still sufficient (Miller and Haneman 1979, Miller et al 1980 to show the incompatibility with experiment of many proposed models. In the last few years more LEED analysis has been carried out and also high-energy transmission electron diffraction of very thin specimens.…”
Section: The Si(ll1) 7 X 7 Surfacementioning
confidence: 99%
“…LEED studies have identified metastable configurations (18), some of which disappear with annealing in vacuum (430). Theoretical fits to LEED data have been compared (380). UPS was used in interpretations of surface, bulk, and resonance states in angle-resolved studies of electronic structure of the superlattice (259,238,237).…”
mentioning
confidence: 99%