2014
DOI: 10.1109/tdmr.2013.2288703
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Life Prediction of High-Cycle Fatigue in Aluminum Bonding Wires Under Power Cycling Test

Abstract: In this paper, a 3-D finite-element (FE) model was established based on real test samples. Coupled electrothermal and thermal-mechanical FE analyses were conducted to analyze the mechanical behavior of bonding wire under cyclic power loading. The current crowding phenomenon may be improved by increasing the wire number. The junction temperature can be decreased by decreasing the joule heat from the current crowding around the bonding wire. The findings suggest that the power module with wire configuration desi… Show more

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Cited by 39 publications
(12 citation statements)
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“…Finite element simulations of bond wires during thermal cycling confirm stress concentration at the heel. 37,38 During active power cycling, an exacerbation of this stress state may occur as a result of forces due to the electromagnetic interaction between the wires leading to lateral displacements. 39 Concurrently, the concentration of stress in the aforesaid regions may mean a greater propensity for microstructural restoration in order to achieve a minimised energy state.…”
Section: Interpretation and Analysis Of Tomography Resultsmentioning
confidence: 99%
“…Finite element simulations of bond wires during thermal cycling confirm stress concentration at the heel. 37,38 During active power cycling, an exacerbation of this stress state may occur as a result of forces due to the electromagnetic interaction between the wires leading to lateral displacements. 39 Concurrently, the concentration of stress in the aforesaid regions may mean a greater propensity for microstructural restoration in order to achieve a minimised energy state.…”
Section: Interpretation and Analysis Of Tomography Resultsmentioning
confidence: 99%
“…Fig.10(a) outlines the schematic of a cyclic power load [27]. The cycle period is 20 s: 10s for power on and 10s for power off.…”
Section: Effect Of Power Loss On Temperature Gradientmentioning
confidence: 99%
“…The IGBT power modules are therefore exposed to both stresses with various levels of temperature swings and frequencies. Previous studies have shown three ageing mechanisms on the bond wires: heel fractures (mechanical 6 IEEE TRANSACTIONS ON POWER ELECTRONICS constraints in the wires and fatigue phenomenon due to the deformation related to temperature swings), wire bond lift-off (mechanical stress on Al-Si joints due to the difference in the thermal expansion coefficient between Al and Si) and metallurgical damage (thermo-mechanical stress on Al coming from the difference in the thermal expansion coefficient between Al and Si) [18], [20], [42]. According to the International Electrotechnical Commission (IEC) [43], two types of cycle periods are considered: the sub-second to tens of seconds regime and the minute-range regime.…”
Section: Bond Wire Lifetime Consumption Analysismentioning
confidence: 99%