2011
DOI: 10.1002/pssc.201084056
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Light‐induced effects on the radiative recombination rate of electron‐hole pairs in a‐Si:H

Abstract: Temperature variation of radiative recombination rate obtained for defect photoluminescence (PL) in high‐quality a‐Si:H after illumination of intense pulsed light is presented and compared with results previously reported for defective a‐Si:H films. We have not found significant difference between the temperature variation of the rate of radiative recombination at photo‐created radiative defects and that at native radiative defects. This fact suggests the recombination processes at the photo‐created defects an… Show more

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Cited by 4 publications
(7 citation statements)
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“…2(a) shows the non-radiative recombination rates estimated by Eqs. (2) and (3) with τ R0 = 0.69 ms. The same results are shown as logP NR vs. T − 1 plots in Fig.…”
Section: Resultsmentioning
confidence: 99%
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“…2(a) shows the non-radiative recombination rates estimated by Eqs. (2) and (3) with τ R0 = 0.69 ms. The same results are shown as logP NR vs. T − 1 plots in Fig.…”
Section: Resultsmentioning
confidence: 99%
“…1 clearly show that P R increases so quickly that P NR /P R decreases with increasing temperature in the range of 120-170 K in the case of HQ1. We have proposed a model [2] in which P R above 100 K increases because of thermal excitation of the holes to shallow tail states extended more than deep tail states. Such an increase of P R is significant when the density of the deep tail states is small [2].…”
Section: Discussionmentioning
confidence: 99%
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