1973
DOI: 10.1016/0030-4018(73)90037-0
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Light modes in thin polyurethane and LiF films

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1975
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Cited by 30 publications
(3 citation statements)
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“…The spread Ag in the gaps of nanocrowns arranged periodically and increased the roughness at the interface of Ag and PMMA, which reduced the light reflection. [36][37][38] However, in type I mode, the strong reflection causes a low light coupling efficiency. Accordingly, a weaker SERS intensity was observed in type I mode.…”
Section: Discussion About the Detection Modementioning
confidence: 99%
“…The spread Ag in the gaps of nanocrowns arranged periodically and increased the roughness at the interface of Ag and PMMA, which reduced the light reflection. [36][37][38] However, in type I mode, the strong reflection causes a low light coupling efficiency. Accordingly, a weaker SERS intensity was observed in type I mode.…”
Section: Discussion About the Detection Modementioning
confidence: 99%
“…Hence, at higher θ, the ratio ( Z p / Z d ) of the analyte thickness Z p = ( d PDDA + d DNA ) N to the decay length of the SPP evanescent field Z d decreases (Figure C, inset), resulting in a smaller Δλ. The relationship between Δλ and N can be numerically calculated by solving the characteristic equation Z p 2 π λ false( ε eff ε SPP false) 1 / 2 arctan true[ ε eff ε d true( ε SPP ε d ε eff ε SPP true) 1 / 2 true] arctan true[ ε eff ε m true( ε SPP ε m ε eff ε SPP true) 1 / 2…”
mentioning
confidence: 99%
“…(a): A, ~LIF=OA; B, 200A; C, 500A; D looOK; E, CO. (b): A, d~is=2000A; B, 3000A; C, 4000A; D, 6000 A.the LiF film. The dispersion of the p-polarized modes with frequency w is given by (seeHornauer and Raether 1973)…”
mentioning
confidence: 99%