2021
DOI: 10.1007/s12633-021-01513-6
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Linearity and Analog Performance Analysis of Silicon Junctionless Bulk FinFET Considering Gate Electrode Workfunction Variability and Different Fin Aspect Ratio

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Cited by 4 publications
(1 citation statement)
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“…The presence of SiGe in the channel region of the stacked channel FinFET increases the electron mobility, resulting in higher output transconductance in the TLSC and DLSC structures. This is because the electrons experience less resistance to their motion, and are able to Junctionless accumulation mode FinFET [23] Junctionless FinFET [24] Junctionless bulk FinFET [25] Gate flow more freely through the channel region. The output transconductance is obtained at a fixed gate voltage.…”
Section: Analysis Of Analog/rf Parametersmentioning
confidence: 99%
“…The presence of SiGe in the channel region of the stacked channel FinFET increases the electron mobility, resulting in higher output transconductance in the TLSC and DLSC structures. This is because the electrons experience less resistance to their motion, and are able to Junctionless accumulation mode FinFET [23] Junctionless FinFET [24] Junctionless bulk FinFET [25] Gate flow more freely through the channel region. The output transconductance is obtained at a fixed gate voltage.…”
Section: Analysis Of Analog/rf Parametersmentioning
confidence: 99%