2019
DOI: 10.4028/www.scientific.net/kem.801.211
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Liquid Capacitor Based on Hafnium Oxide

Abstract: In this work, we synthesize Hafnium (IV) oxide (HfO2) ink from hafnium chloride (HfCl4) powder assisted with deionized water. The poly acrylic acid (PAA) is used as surfactant to decrease the surface tension. Conversion of HfCl4 into HfO2 was detected by Raman spectroscopy and energy dispersive X-ray spectroscopy (EDS) characterization techniques. This proposed ink can be easily synthesized at a low temperature. Using the synthesis ink, a liquid capacitor is proposed, which is tested for electrochemical analys… Show more

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Cited by 3 publications
(2 citation statements)
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“…The Raman spectra of heterostructure thin films also reveal the peaks of monoclinic HfO 2 , which can be seen quite clearly and are located at (A g ) 153 cm −1 , (B g ) 168 cm −1 and (A g ) 268 cm −1 modes. This is comparable to the findings that have been published for HfO 2 in the relevant literature [ 44 , 45 ].
Fig.
…”
Section: Resultssupporting
confidence: 91%
“…The Raman spectra of heterostructure thin films also reveal the peaks of monoclinic HfO 2 , which can be seen quite clearly and are located at (A g ) 153 cm −1 , (B g ) 168 cm −1 and (A g ) 268 cm −1 modes. This is comparable to the findings that have been published for HfO 2 in the relevant literature [ 44 , 45 ].
Fig.
…”
Section: Resultssupporting
confidence: 91%
“…As can be seen, the Raman spectra at points 1 and 2 (the oxidized surface and the one closest to the surface crack of the sample in the region of the HfO 2 -SiO 2 layer, respectively) have the same set of bands. A detailed analysis of these spectra reveals 14 characteristic bands (ω 1 -ω 14 at 150, 165, 241, 257, 332, 381, 398, 499, 525, 554, 578, 631, 671 and 756 cm −1 ) of different intensities belonging to the Ag and Bg modes of the monoclinic phase of HfO 2 , in good agreement with the literature data [62][63][64][65]. In addition to the monoclinic HfO 2 phase, seven characteristic Raman modes of the ω H1 -ω H7 phase of hafnone (HfSiO 4 ) are detected at these sites at 442, 808, 854, 907, 937, 976 and 1028 cm −1 , which are also in good agreement with the available literature data [66][67][68][69].…”
Section: Test Conditionssupporting
confidence: 89%