2000
DOI: 10.1016/s0921-4534(00)00976-x
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Local characterization of HTS thin films by laser scanning microscopy

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Cited by 5 publications
(5 citation statements)
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“…In low-temperature laser scanning microscopy, thermoelectric or bolometric voltages induced in the samples by irradiation with a scanned laser beam are utilized to image the transport properties of the grain boundaries, with submicrometer resolution at best (Divin et al, 1991;Shadrin et al, 1998Shadrin et al, , 1999Korolev et al, 2000).…”
Section: Viid)mentioning
confidence: 99%
“…In low-temperature laser scanning microscopy, thermoelectric or bolometric voltages induced in the samples by irradiation with a scanned laser beam are utilized to image the transport properties of the grain boundaries, with submicrometer resolution at best (Divin et al, 1991;Shadrin et al, 1998Shadrin et al, , 1999Korolev et al, 2000).…”
Section: Viid)mentioning
confidence: 99%
“…By scanning the beam it becomes possible to determine the sample's local electrical characteristics. The technique is well suited for determining the electrical homogeneity of a superconducting thin film [3], [4], [9]- [11].…”
Section: Laser Scanning Microscopymentioning
confidence: 99%
“…This reduces the overall current carrying capacity of the film. The image obtained by rastering the beam can be used to determine the homogeneity of local current carrying capacity of the film [3], [4]. The second mode allows for a thermoelectric measurement that is carried out on an unbiased bridge.…”
Section: Laser Scanning Microscopymentioning
confidence: 99%
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