Local fracture of thin metallic films during electromagnetic loading

Emelyanov, Oleg

doi:10.1134/s1063784208070098

Cited by 18 publications

(10 citation statements)

References 10 publications

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“…In conductive media such local electric field concentration leads to current concentration. In Emel’yanov (2008) quasi-static approximation resulted in twenty-fold increase of the initial current density.…”

Section: Discussionmentioning

confidence: 99%

“…To describe the events leading to the damage observed in the images, we will use the model of the crack opening in thin Al films during microsecond duration pulses described in Emel’yanov (2008). This model is expanded for our case by including elements of self-similarity.…”

Section: Extended Model Of the Crack Opening With Elements Of Self-similaritymentioning

confidence: 99%

“…We extend geometrical configuration of crack with elements of self-similarity to explain dynamics of the process. The crack in Emel’yanov (2008) was modeled as having rectangular shape with length H 1 and width d 1 and directed along x axis. The tip of the crack is presented as semicircle with radius R 1 = d 1 /2 as shown in Figure 6.…”

Section: Extended Model Of the Crack Opening With Elements Of Self-similaritymentioning

confidence: 99%

“…As an example, a three stage opening of the crack is used for current and magnetic field estimations. The current density j n in the semi-ring area after fast crack opening within the distance H n is found using approximate formula obtained by conformal mapping technique (Emel’yanov, 2008): …”

Section: Extended Model Of the Crack Opening With Elements Of Self-similaritymentioning

confidence: 99%

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Fast damaging processes in the TaN thin film absorbers under action of nanosecond electrical pulses

Ardaravičius

Kersulis

Kiprijanovič

et al. 2016

IJSI

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Purpose The purpose of this paper is to investigate damaging processes in TaN thin film absorbers under action of high-voltage electrical pulse of nanosecond duration. Despite having mechanical origin of crack opening, estimation based on the readings from oscillograms shows uncharacteristically high velocities of the crack propagation. Design/methodology/approach Microscopic images of damaged absorbers showing the final result of the damaging process provided initial information about its geometrical peculiarities. Then, to clarify the dynamics of the process, the authors create the model of the crack, having elements of self-similarities and multiple stage opening. The influence of heating induced by current concentration at crack tip and of magnetic stress of this concentrated current are both included in the model. Findings Using physical parameters of TaN layers with flowing current and performing calculations the authors define the conditions required to initiate the damaging process and to sustain it. Danger of such damage is relevant for high-Tc superconducting thin films after their switching to normal state which is induced by the high-voltage pulse. Practical implications There were made recommendations to manufactures aiming to improve electrical durability of the absorbers in an effort to prevent the damaging influence of power nanosecond electrical pulses. Originality/value Three stage opening model implies the appearance of zone of high-energy dissipation that can lead to detonation-like destruction of the film and, therefore, explain the high velocities of crack propagation.

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Section: Discussionmentioning

confidence: 99%

Section: Extended Model Of the Crack Opening With Elements Of Self-similaritymentioning

confidence: 99%

Section: Extended Model Of the Crack Opening With Elements Of Self-similaritymentioning

confidence: 99%

Section: Extended Model Of the Crack Opening With Elements Of Self-similaritymentioning

confidence: 99%

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Fast damaging processes in the TaN thin film absorbers under action of nanosecond electrical pulses

Ardaravičius

Kersulis

Kiprijanovič

et al. 2016

IJSI

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“…Relatively low heat conductivity and high resistivity of YBaCuO in N state and current concentration at crack tips can develop uncontrolled temperature growth at the tips and their motion with high velocities -so-called dissipative instability [8]. Situation when the crack tip moves simultaneously with S-N switching is worth noting.…”

Section: Discussion Of Resultsmentioning

confidence: 99%

Applicable Damage of High-T_cYbaCuO Superconducting Tapes by Current and Laser Pulses

et al. 2011

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Damage and irreversible damage of YBaCuO tapes with high density current after switching from superconducting to normal state are investigated. Quasi-homogeneous current distribution across the tape in superconducting state can cause perfect tape damage or irreversible damage when current is slightly above critical value. The model of the tape heating during the optically initiated switching from superconducting to normal state is proposed. Analysis of causes inducing damage shows necessity to consider 0.5T m damage criterion because of strong current influence on the damage processes. Possible damage mechanisms are described and crack tips motion simultaneously with switching from superconducting to normal state is considered. Application of optically illuminated YBaCuO tapes with nanosecond duration current pulses on the base of the described mechanisms is proposed.

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Electric current-induced solid-state crack healing and life extension

Telpande,

Kumar,

Sharma

et al. 2025

Acta Materialia

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Local fracture of thin metallic films during electromagnetic loading

Cited by 18 publications

References 10 publications

Fast damaging processes in the TaN thin film absorbers under action of nanosecond electrical pulses

Fast damaging processes in the TaN thin film absorbers under action of nanosecond electrical pulses

Applicable Damage of High-T_cYbaCuO Superconducting Tapes by Current and Laser Pulses

Electric current-induced solid-state crack healing and life extension

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Local fracture of thin metallic films during electromagnetic loading

Cited by 18 publications

References 10 publications

Fast damaging processes in the TaN thin film absorbers under action of nanosecond electrical pulses

Fast damaging processes in the TaN thin film absorbers under action of nanosecond electrical pulses

Applicable Damage of High-TcYbaCuO Superconducting Tapes by Current and Laser Pulses

Electric current-induced solid-state crack healing and life extension

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Product

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Applicable Damage of High-T_cYbaCuO Superconducting Tapes by Current and Laser Pulses