Local strain redistribution in a coarse-grained nickel-based superalloy subjected to shot-peening, fatigue or thermal exposure investigated using synchrotron X-ray Laue microdiffraction

Altinkurt, Gader; Fèvre, Mathieu; Géandier, Guillaume; Dehmas, Moukrane; Robach, Odile; Micha, Jean Sébastien

doi:10.1007/s10853-018-2144-4

Cited by 6 publications

(3 citation statements)

References 41 publications

(53 reference statements)

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“…Indexing a Laue diffraction pattern allows the crystallographic orientation, and in certain cases lattice elastic strains and defects of the sample, to be determined (Sheremetyev et al, 1991;Marı ´n & Die ´guez, 1999;Maaß et al, 2006;Xu et al, 2017;Deillon et al, 2019). With the development of Laue microdiffraction, which utilizes a focused beam, nondestructive 3D characterization can be achieved with submicrometre spatial resolution (Larson et al, 2002;Larson & Levine, 2013;Hofmann et al, 2012;Cornelius & Thomas, 2018;O ¨rs et al, 2018;Altinkurt et al, 2018). As a consequence, Laue microdiffraction is today a major tool for materials characterization.…”

Section: Introductionmentioning

confidence: 99%

“…As a consequence, Laue microdiffraction is today a major tool for materials characterization. Examples of established techniques include methods based on both synchrotron and laboratory source X-rays (Larson et al, 2002;Tamura et al, 2003;Levine et al, 2006;Lynch, Stevenson et al, 2007;Lynch, Tamura et al, 2007;Hofmann et al, 2012;Larson & Levine, 2013;Zhou et al, 2016;Cornelius & Thomas, 2018;O ¨rs et al, 2018;Altinkurt et al, 2018).…”

Section: Introductionmentioning

confidence: 99%

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Indexing of superimposed Laue diffraction patterns using a dictionary–branch–bound approach

et al. 2022

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X-ray Laue diffraction is an important method for characterizing the local crystallographic orientation and elastic strain in polycrystalline materials. Existing analysis methods are designed mainly to index a single or a few Laue diffraction pattern(s) recorded in a detector image. In this work, a novel method called dictionary–branch–bound (DBB) is presented to determine the crystallographic orientations of multiple crystals simultaneously illuminated by a parallel X-ray incident beam, using only the spot positions in a detector image. DBB is validated for simulated X-ray Laue diffraction data. In the simulation, up to 100 crystals with random crystallographic orientations are simultaneously illuminated. Fake spots are randomly added to the detector image to test the robustness of DBB. Additionally, spots are randomly removed to test the resilience of DBB against true spots that are undetected due to background noise and/or spot overlap. Poisson noise is also added to test the sensitivity of DBB to less accurate positions of detected spots. In all cases except the most challenging one, a perfect indexing with a mean angular error below 0.08° is obtained. To demonstrate the potential of DBB further, it is applied to synchrotron microdiffraction data. Finally, guidelines for using DBB in experimental data are provided.

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Section: Introductionmentioning

confidence: 99%

Section: Introductionmentioning

confidence: 99%

Indexing of superimposed Laue diffraction patterns using a dictionary–branch–bound approach

et al. 2022

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“…There are many publications studying the stress state on the different regions of a shot-peened material and their evolution with temperature and/or during mechanical loading, mainly because the experimental techniques for such studies are well established [10][11][12][13][14][15]. On the other hand, strain localization in the form of slip bands, persistent slip bands (PSB) and deformation twins are commonly studied by means of different electron microscopy techniques.…”

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confidence: 99%