“…Later, the developments involved using nonelectrochemical signals (e.g., shear force − and atomic force microscopy (AFM) − ) to independently determine the probe–sample distance for SECM and SICM, which allowed topography of the sample to be analyzed separately from the electrochemical activity. SECM and SICM, as well as their combination with other techniques, have been well developed as powerful methodologies for measuring kinetics of heterogeneous charge transfer on electrodes, − analyzing the biological activity of proteins and living cells, − evaluating localized corrosion behavior of metals, − and patterning/etching various materials. ,− …”