2008
DOI: 10.1117/12.797415
|View full text |Cite
|
Sign up to set email alerts
|

Localized measurements of optical thickness variations in femtosecond trimmed structures

Abstract: Currently, the utilization of high power ultrafast lasers to induce optical changes in structures for the purpose of locally drawing patterns with dimensions inferior to the diffraction limit is well-established and controlled. Using this technique, we aim to modify the refractive index and/or the geometrical parameters of an optical interferential filter composed of successive thin layers. This local optimization will then allow the improvement or tuning of the performances of the optical filters. Thereafter,… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...

Citation Types

0
0
0

Year Published

2010
2010
2010
2010

Publication Types

Select...
1

Relationship

0
1

Authors

Journals

citations
Cited by 1 publication
references
References 20 publications
0
0
0
Order By: Relevance