2008
DOI: 10.1063/1.2825466
|View full text |Cite
|
Sign up to set email alerts
|

Low 1∕f noise, full bridge, microcantilever with longitudinal and transverse piezoresistors

Abstract: This paper reports on low 1∕f noise, low corner-frequency, piezoresistive microcantilevers suitable for static and slowly time varying, force and displacement sensing applications such as chemical and biosensing. We demonstrate a full bridge, piezoresistive cantilever with greater than 140dB dynamic range, a noise amplitude spectral density floor of 3.7nV∕V√Hz at 0.1Hz. At 1.0Hz, the noise spectral density is 1.2nV∕V√Hz equivalent to 10pN∕√Hz or 5pm∕√Hz. The force resolution over the frequency band of 0.1–100H… Show more

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1
1
1

Citation Types

1
20
0
1

Year Published

2009
2009
2018
2018

Publication Types

Select...
5
1
1

Relationship

0
7

Authors

Journals

citations
Cited by 24 publications
(22 citation statements)
references
References 14 publications
1
20
0
1
Order By: Relevance
“…Table V presents Table V are based on a peSSImIStIC Hooge coefficient (0: = 10-3) -this is usually found in metal resistors [11]. However, the Hooge coefficient for high con centration piezoresistors is much lower than for metal resis tors [12]. The carriers concentration q is 2.1 X 10 19 (lIcm3).…”
Section: Noise Analysismentioning
confidence: 98%
“…Table V presents Table V are based on a peSSImIStIC Hooge coefficient (0: = 10-3) -this is usually found in metal resistors [11]. However, the Hooge coefficient for high con centration piezoresistors is much lower than for metal resis tors [12]. The carriers concentration q is 2.1 X 10 19 (lIcm3).…”
Section: Noise Analysismentioning
confidence: 98%
“…Es liegt jedoch in der selben Größenordnung wie bei vergleichbaren Anordnungen [23]. Da die genauen Prozessparameter der Dotierung nicht veröffentlicht sind, kann ein Grund in der fehlerhaften Annahme des Parameters α liegen, welcher abhängig von Dotierungstiefe und Annealing-Temperatur Werte im Bereich von 10 -3 bis 10 -6 annehmen kann [17; 23].…”
Section: Silizium-dmsunclassified
“…However, values of ␣ as low as 10 −7 have been reported for implanted piezoresistors 34 and specific fabrication processes ͑e.g., reactive ion etching͒ have been shown to affect the 1 / f noise performance of piezoresistors. 35 The Wheatstone bridge is composed of two piezoresistors which are uncorrelated 1 / f noise sources so the 1 / f noise power is increased by a factor of 2 ͑voltage increased by ͱ 2͒, and the integrated voltage noise power is…”
Section: Hooge Noisementioning
confidence: 99%
“…Additionally, in cases where the 1 / f noise of the piezoresistor is less than that of the instrumentation amplifier it is necessary to use an ac modulation technique. 34 Based on our results, the optimal piezoresistor design has greater 1 / f noise than the instrumentation amplifier for many applications and the measurement electronics can use a simple dc bias configuration. We optimized cantilevers for several commercial instrumentation amplifiers to explore the effect of system noise on cantilever design ͑Table II͒.…”
Section: B Balancing the Noisementioning
confidence: 99%